Zoran Corporation

Oak Technology, Inc.

Li-Huan Jen

Kevin Chiang

Shengquan Wu

A method and system are disclosed for counting error rates occurring within an optical compact disk system as data is read from an optically encoded compact disk. In a preferred embodiment error flag data are generated as errors occur within the optical compact disk system. From the error flag data, error flag bits corresponding to errors in reading information from an optically encoded disk are identified for further processing. Further processing includes, among other things, generating an error rate over a predetermined time period. The operation of some or all of the functions within the optical compact disk system may be interrupted upon the exceeding of a predetermined threshold error rate. From the error rate information, the hardware, software and firmware within the optical compact disk system may be optimized for increased performance.

Apparatus and method for counting error rates in an optical compact disc storage system

A method and system are disclosed for counting errors occurring within an optical compact disk system as data is read from an optically encoded compact disk. In a preferred embodiment error flag data are generated as errors occur within the optical compact disk system. From the error flag data, error flag bits corresponding to errors in reading information from an optically encoded disk are identified for further processing. Further processing includes, among other things, keeping a total count of errors, keeping a count of single occurring errors, keeping a count of multiple occurring errors. Furthermore, by keeping error count information, the operation of the optical compact disk system may be interrupted upon the exceeding of a predetermined threshold. From the error count information the hardware, software and firmware within the optical compact disk system is optimized for increased performance.

Apparatus and method for counting errors in an optical compact disc storage system

A method for set-up of a group of parameter values needed in a CD-R or CD-RW write cycle, where the time allotted for set-up is as low as six clock cycles. In a clock cycle from a preceding write cycle, first and second parameter values are read into first and second registers, and a third parameter value is read into a first SRAM. In clock cycles 1-5 of the present write cycle, fourth, fifth, sixth, seventh and eighth parameter values are read into second, third, fourth, fifth and sixth SRAMs. In clock cycle no. 6 or later of the present write cycle, three sums (or differences) of selected combinations of these eight parameter values are calculated and stored, new first and second parameter values are read into first and second registers, and a new third parameter value is read into another SRAM. The method is generalized to K parameters stored in registers, N parameters stored in SRAMs and calculation of M selected linear combinations of the K&plus;N parameter values.

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Santa Clara, CA, United States of America

Li-Huan Jen