Tektronix, Inc.

Lester L Larson

Daniel G Knierim

Ira G Pollock

Josiah A Bartlett

Kenneth P Dobyns

Scott R Jansen

Michael Duane Stevens

William R Mark

J Steve Lyford

Gary W Reed

Kevin E Cosgrove

Roland E Andrews

Donald F Murray

Ronald A Acuff

A Roy Kaufman

Colin L Shepard

Collin L Shepard

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Signal acquisition system having reduced probe loading of a device under test

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable with the signal cable coupled to a signal processing instrument via an input node. The input node is coupled to an input current amplifier via input circuitry. The input circuitry provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The termination of the resistive center conductor signal cable in the signal processing instrument provides a signal acquisition system where the capacitive loading of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuitry resulting in an increase in the signal acquisition system bandwidth.

Signal acquisition system having probe cable termination in a signal processing instrument

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Signal acquisition system having a compensation digital filter

A test and measurement instrument and a method of calibrating the test and measurement instrument including a reference signal generator; multiple input channels; and multiple input circuits. Each input channel is coupled to a corresponding input circuit; and one of the input circuits is coupled to the reference signal generator.

Test and measurement instrument and method of calibrating

An instrument includes a probe providing a single signal path for conveying a signal from a circuit under test to the instrument. A receiver circuit within the instrument divides the path into an analog path and a digital path. The digital path includes a comparator for determining the logic state of the signal and producing a digital representation of the signal under test. The analog path includes a multiplexer to selectively couple one of a plurality of analog input signals to an output terminal for viewing on an oscilloscope. Preferably, the probe head includes a buffer amplifier to reduce loading on the circuit under test and to increase bandwidth of the signals conveyed along the test cable to the instrument. An electrically trimmable resistor is employed to terminate the transmission line of the test cable in its characteristic impedance in order to reduce reflections and maintain transmission bandwidth.

Capturing both digital and analog forms of a signal through the same probing path

A multi-channel, low input capacitance signal probe head has a housing that receives one or more substrates having input signal pads exposed on one end of the substrate. The substrate is positioned in the housing such that the signal contact pads are exposed at an open end of the housing. A removable signal contact holder mounts to the housing and supporting electrically conductive elastomer signal contacts. The holder is disposed over an open end of housing such that the elastomer signal contacts engage the input signal pads. A probe head retention member is provided for securing the multi-channel signal probe head to a device under test.

Growing community of inventors

Portland, OR, United States of America

Lester L Larson