International Business Machines Corporation

Les Mark DeBruyne

Thomas Andrew Sartorius

Anthony Correale, Jr

Rodney Wayne Smith

Jeffrey Todd Bridges

Michael Scott McIlvaine

Robert L Goldiez

Thomas Anderson Dick

Jay Donnelly Grollimund

Waleed K Al-Assadi

Method and apparatus for increasing the number of real memory addresses accessible through a translational look-aside buffer (TLB) by a multi thread CPU. The buffer entries include a virtual address, a real address and a special mode bit indicating whether the address represents one of a plurality of threads being processed by the CPU. If the special mode bit is set, the real address associated with the virtual address higher order bits are concatenated with the thread identification number being processed to obtain a real address. Buffer entries containing no special mode bit, or special mode bit set to 0, are processed by using the full length of the real address associated with the virtual address stored in the look-aside buffer (TLB).

Translation look aside buffer (TLB) with increased translational capacity for multi-threaded computer processes

A semiconductor device is disclosed that include a built-in self test system. The device comprises a logic function and a self test engine coupled and integrated with the logic device. The device includes a performance code storage coupled and integrated with the logic function. The performance code storage contains at least one critical path pattern that will be run on the logic function to determine the performance of the logic function when the self test engine causes the logic function to be in a performance test mode. In summary, a performance sort/validate integrated custom logic device, like a microprocessor core can be tested without the need for a separate, high-performance tester. A performance built-in self test (PBIST) approach provides a basic test procedure to be utilized within the device. An integrated memory array, such as the L1-cache, is provided wherein a select set of SRAM memory words are preconditioned at the time of manufacture to contain predefined functional patterns.

Performance built-in self test system for a device and a method of use

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Cary, NC, United States of America

Les Mark DeBruyne