Nxp Usa, Inc.

Freescale Semiconductor,inc.

LeRoy Winemberg

Jae Woong Jeong

Dat Tat Tran

Anis Mahmoud Jarrar

Xiaoxiao Wang

Ender Yilmaz

Nisar Ahmed

Orman G Shofner, Jr

Jorge Arturo Corso

Jifeng Chen

Balaji Rajasekaran

An integrated circuit includes a voltage monitor circuit having a first input coupled to a reference voltage and a second input, a successive approximation register (SAR) circuit having an input coupled to an output of the voltage monitor circuit, a low drop out (LDO) regulator having an input coupled to an output of the SAR circuit and an output coupled to the second input, a discharge circuit coupled to the LDO output, voltage sensing circuit having a first input coupled to the reference voltage during a trim mode and coupled to the LDO output during a monitor mode, having a second input coupled to the reference voltage, and an output which asserts a sense indicator that indicates when a voltage at the first input goes higher or lower than the reference voltage by a predetermined amount. Control circuitry is configured to, during trim mode, periodically discharge the LDO output voltage.

Device and method for calibrating a voltage regulator

A semiconductor device includes a trimming circuit for a power management circuit. The trimming circuit includes an analog to digital converter (ADC) circuit with a comparator circuit, a successive approximation register (SAR) circuit having an input coupled to an output of the comparator circuit, a control circuit coupled to the SAR circuit, a digital to analog converter (DAC) circuit having inputs selectively couplable to digital output signals of the SAR circuit and an output coupled to a first input of the comparator circuit, and a variable resistance circuit configured to be selectively coupled to output signals of the ADC circuit.

On-chip trimming circuit and method therefor

An integrated circuit device includes a substrate, a voltage monitor circuit formed on the substrate, and a trimming circuit formed on the substrate that includes a successive approximation register circuit having an input coupled to an output of the voltage monitor circuit; a beta multiplier circuit having an input coupled to an output of the successive approximation register circuit, an output coupled to a first input of the voltage monitor circuit, and a variable resistance circuit. A resistance value of the variable resistance circuit is controlled by the output of the successive approximation register.

Voltage monitor with a trmimming circuit and method therefore

An integrated circuit includes a clock generator to generate a first clock signal, a delay circuit to generate a second clock signal as a delayed version of the first clock signal, and a plurality of series-connected delay elements having a plurality of outputs, wherein each output from an initial output to a last output is configured to provide the second clock signal delayed by an increasing number of series-connected delay elements. The circuit includes a plurality of flip-flops, wherein a first input of each flip flop is coupled to receive the first clock signal and a second input of each flip flop from an initial flip-flop to a last flip-flop is coupled to receive a corresponding output of the series-connected delay elements from the initial output to the last output, respectively. The circuit includes a plurality of sticky flops, each corresponding to a flip-flop of the plurality of flip-flops.

Power supply noise sensor

A low dropout regulator (LDO) system includes a first pseudo random binary sequence (PRBS) generator configured to output a first PRBS signal; an LDO configured to output an LDO output signal and having an error amplifier, wherein the first PRBS generator is coupled to an input of the error amplifier; a second PRBS generator configured to output a second PRBS signal; and a correlator coupled to the LDO and second PRBS generator and configured to correlate the LDO output signal with the second PRBS signal to provide an impulse response data sample of the LDO.

Systems and methods for built-in self test of low dropout regulators

System circuitry includes a logic circuit having an input and an output that is a functional element of the system circuitry. Pattern application circuitry is coupled to the input of the logic circuit and provides an input pattern to the input of the logic circuit. The input pattern has a valid signature based upon a comparison of the input and the output of the logic circuit when the logic circuit is functioning properly. A logic comparator is coupled to the input and the output of the logic circuit and generates pulses in response to the input pattern. A counter is coupled to the logic comparator that obtains a count of the pulses generated by the logic comparator in response to the input pattern. A signature comparator is coupled to the counter and generates a warning signal if the valid signature is different from the count.

Functional path failure monitor

A data processing system on an integrated circuit includes a core that performs switching operations responsive to a system clock that draws current from the power supply network. An IR-drop detector includes a resistor ladder having outputs representative of an IR-drop caused by the core during the switching operations. The system further includes a plurality of amplifiers coupled to the outputs indicative of the IR-drop, a plurality of flip-flops coupled to the amplifiers, and a variable clock generator. The variable clock generator outputs a sampling clock comprising a group consisting of a variable phase or a variable frequency to the plurality of flip-flops. The flip-flops are triggered by the sampling clock so that the IR-drop at a time during a clock cycle of the system clock can be detected, and the peak IR-drop value for can be tracked.

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Austin, TX, United States of America

LeRoy Winemberg