Intel Corporation

Leonhard Heiss

Vani Deshpande

Dharmaray Nedalgi

Karthik Ns

Amit Kumar Srivastava

Reiner Schwab

Andreas Lachmann

An apparatus is provided which comprises: a dual stack voltage driver, wherein the dual stack voltage driver comprises a first stack of transistors, and a second stack of transistors; and one or more feedback transistors each coupled to a transistor of the second stack of transistors.

Apparatus and method for over-voltage protection

An apparatus for predicting a future state of an electronic component is provided. The apparatus includes a measuring unit configured to measure a waveform of a signal related to the electronic component. Further, the apparatus includes a processing unit configured to calculate a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal.

Apparatus and a method for predicting a future state of an electronic component

An apparatus is provided which comprises: a stack of transistors of a same conductivity type, the stack including a first transistor and a second transistor coupled in series and having a common node; and a feedback transistor of the same conductivity type coupled to the common node and a gate terminal of the first transistor of the stack.

Growing community of inventors

Warngau, Germany

Leonhard Heiss