Mks Instruments, Inc.

Leonard I Kamlet

Barbara Marshik-Geurts

Martin L Spartz

Vidi A Saptari

Charles Mark Phillips

David Marran

Sylvie Bosch-Charpenay

Jorge E Neira

A method is provided for monitoring one or more silicon-containing compounds present in a biogas. The method includes generating a first absorption spectrum based on a ratio of a first spectral measurement and a second spectral measurement. The first spectral measurement is from a non-absorptive gas having substantially no infrared absorptions in a specified wavelength range of interest and the second spectral measurement is from a sample gas comprising the biogas. The method includes generating at least one surrogate absorption spectrum based on, at least, individual absorption spectrum for each of a subset of one or more silicon-containing compounds selected from a larger set of known silicon-containing compounds with known concentrations. A total concentration of the one or more silicon-containing compounds in the biogas can be calculated based on the first absorption spectrum and the at least one surrogate absorption spectrum.

Method and apparatus for siloxane measurements in a biogas

A method for monitoring of siloxane compounds in a biogas includes the step of generating a first absorption spectrum based on a ratio of a first spectral measurement and a second spectral measurement. The first spectral measurement is from a non-absorptive gas having substantially no infrared absorptions in a specified wavelength range of interest and the second spectral measurement is from a sample gas comprising the biogas. The method also includes the step of calculating a concentration of at least one siloxane compound in the biogas using a second absorption spectrum based on, at least, a first individual absorption spectrum for a known concentration of the at least one siloxane compound.

A method and apparatus is disclosed for signal spectrometry using an improved apodization function. Such method and apparatus involve (i) obtaining sample and reference time domain waveforms; (ii) applying sample and reference apodization waveforms to the sample and reference time domain waveforms, such that substantially same weight is applied to corresponding substantially coextensive regions of the sample and reference time domain waveforms, (iii) transforming the sample and reference apodized waveforms from the time domain into the frequency domain; and (iv) generating referenced spectral analysis waveform for signal analysis from a ratio of the transformed sample and reference frequency spectra, the spectral analysis waveform substantially excluding frequencies associated with the corresponding substantially coextensive regions of the apodized sample and reference time domain waveforms.

Growing community of inventors

Andover, MA, United States of America

Leonard I Kamlet