Hitachi, Ltd.

Computer and Automation Research Institute, Hungarian Academy of Sciences

Lengyel Attila

Yoichi Nonaka

Yuuichi Suginishi

Monostori Laszlo

Kadar Botond

A control unit () of a production index information generating device () groups, based on log information of a production device, processing targets to generate groups for which end time of processing falls within a predetermined interval, classifies the processing targets contained in the groups into classes based on a number of the processing targets contained in each of the groups, generates cycle time information for each of the classes, which specifies cycle time of each of the processing targets contained in corresponding one of the classes, and determines a production capability of the production device. Accordingly, an index specifying a capability of the production device may be obtained with ease.

Production index information generating device, program therefore, and production information generating method

A dynamic maintenance planning apparatus including a maintenance planning device and a priority calculating device is provided. The maintenance planning device determines a maintenance date and time on and at which the throughput of a manufacturing system is maximum from among possible maintenance dates and times based on a simulation result in which a specific manufacturing apparatus on a manufacturing system is stopped at a specified maintenance date and time, and, for the maintenance at the determined maintenance date and time, specifies a lot whose completion is predicted to be delayed. The priority calculating device calculates a priority of the lot whose completion is predicted to be delayed so as to prevent waiting time of the lot during the maintenance.

Dynamic maintenance planning apparatus

A method and system of specifying a device that is the root cause of impeding productivity of a production line in consideration of even mutual influence among processes of production fluctuation with respect to the subject of specifying a device in which productive capacity is reduced due to a problem that the productive capacity of the device is changed due to production that one machine works for multiple process and a problem that the productive capacity of device is changed due to high product mix and low product volume production. A measure for changing productive capacity of devices intentionally and simulating influence to the whole production system, a measure for measuring mutual influence among processes of production fluctuation produced by the simulation and a measure for specifying a device that is the root cause of impeding the productivity on the basis of the measured result are provided.

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San Jose, CA, United States of America

Lengyel Attila