Vibrant Corporation

Other

Mechanical Solutions, Inc.

Optomec Design Company

Installation Systems, LLC

Lemna J Hunter

Leanne Jauriqui

Greg Weaver

Michael J Renn

Marcelino Essien

Bruce H King

James J Schwarz

Christopher Dennis Ziomek

Shawn A Knapp-Kleinsorge

A part evaluation tool is disclosed and which may be used to assess a part-under-test for use in a system. A plurality of natural frequencies for a system operated at a first steady-state operational are identified. A vibrational response of a part-under-test is acquired, and resonance frequencies within this vibrational response are identified. Resonance frequencies of the part-under-test are compared with the identified natural frequencies for purposes of classifying the part as compliant (e.g., suitable for use in the system) or non-compliant (e.g., not suitable for use in the system).

Part evaluation based upon system natural frequency

Generation of feedback for a part production process based on vibrational testing of parts produced by the part production process. A response characteristic may be identified from vibrational data regarding the parts that is correlated to a process variable of the part production process. The response characteristic may relate to a state of the process variable such that identification of the response characteristic may allow for generation of feedback regarding adjustment of a process control. Such response characteristic may relate to a vibrational metric regarding vibrational data and may comprise identifying a trend in data between a plurality of parts. Also presented are approaches to evaluation of parts, including batch evaluation of parts in which collective vibrational data regarding a plurality of parts belonging to a batch are analyzed. The process control aspects may be performed independently or in combination with part evaluation.

Use of resonance inspection for process control

Various embodiments relating to resonance inspections and in-service parts are disclosed. One protocol () includes conducting a resonance inspection of an in-service part (). The frequency response of the in-service part may be compared with a resonance standard () for purposes of determining whether or not the in-service part is changing abnormally (). An in-service part that is identified as changing abnormally may be characterized as being 'rejected' (). An in-service part that is no identified as changing abnormally may be characterized as being 'accepted' ().

Utilizing resonance inspection of in-service parts

A part () may be subjected to both a resonance inspection and a surface vibration inspection. Various protocols () are disclosed as to how the results of one or more of these inspections may be used to evaluate the part ().

Part evaluation system/method using both resonance and surface vibration data

A waveform generator and a signal analyzer are respectively provided in electrical communication with an input transducer and an output transducer capable of conversion between electrical and acoustic signals, and in mechanical communication with a part. A processor coupled with the waveform generator and signal analyzer receives a set of parameters defining a frequency scan from which it determines a number of frequency sweeps to be performed by the waveform generator. Each of the frequency sweeps has a number of frequencies less than a maximum capacity of the waveform generator, and for each frequency sweep, the processor instructs the waveform generator to excite the input transducer and synchronously receiving a response signal with the signal analyzer at multiple frequencies.

Acoustic systems and methods for nondestructive testing of a part through frequency sweeps

Apparatuses and processes for maskless deposition of electronic and biological materials. The process is capable of direct deposition of features with linewidths varying from the micron range up to a fraction of a millimeter, and may be used to deposit features on substrates with damage thresholds near 100&#xb0; C. Deposition and subsequent processing may be carried out under ambient conditions, eliminating the need for a vacuum atmosphere. The process may also be performed in an inert gas environment. Deposition of and subsequent laser post processing produces linewidths as low as 1 micron, with sub-micron edge definition. The apparatus nozzle has a large working distance&#x2014;the orifice to substrate distance may be several millimeters&#x2014;and direct write onto non-planar surfaces is possible.

Apparatuses and method for maskless mesoscale material deposition

A traction device for a downhill ski. In one embodiment the traction device includes a traction member which is movably interconnected with the downhill ski. At least one biasing member actively biases this traction member toward a position where at least a portion of the traction member will extend beyond the entire lower surface of the downhill ski or an &ldquo;active&rdquo; position. However, the traction member can be retained in a non-traction or &ldquo;inactive&rdquo; position by a latch. Appropriate movement of the latch allows the biasing member(s) to move the traction member into the desired traction position. The end of a ski pole can be used to activate the latch and initiate movement of the traction member. In one embodiment this traction device is integrated with the structure of the binding. This allows the traction device to be automatically moved to its &ldquo;active&rdquo; position whenever a ski boot comes out of the binding, such that the traction device in this instance will act as a ski brake. However, the traction device can be selectively and manually moved to either its active or inactive position while the ski boot is disposed in the binding.

Downhill ski with integrated binding/traction device

A traction device for a downhill ski is disclosed. In one embodiment the traction device includes a traction member which is movably interconnected with the downhill ski. At least one biasing member actively biases this traction member toward a position where at least a portion of the traction member will extend beyond the entire lower surface of the downhill ski or an &ldquo;active&rdquo; position. However, the traction member can be retained in a non-traction or &ldquo;inactive&rdquo; position by a latch. Appropriate movement of the latch allows the biasing member(s) to move the traction member into the desired traction position. The end of a ski pole can be used to activate the latch and initiate movement of the traction member. In one embodiment this traction device is integrated with the structure of the binding. This allows the traction device to be automatically moved to its &ldquo;active&rdquo; position whenever a ski boot comes out of the binding, such that the traction device in this instance will act as a ski brake. However, the traction device can be selectively and manually moved to either its active or inactive position while the ski boot is disposed in the binding.

A traction device for a downhill ski is disclosed. In one embodiment the traction device includes a traction member which is pivotally interconnected with the downhill ski. At least one biasing member actively biases this traction member toward a position where at least a portion of the traction member will extend beyond the entire lower surface of the downhill ski. However, the traction member can be retained in a non-traction position by a latch. Appropriate movement of the latch allows the biasing member(s) to pivot the traction member into the desired traction position. The end of a ski pole can be used to activate the latch and initiate movement of the traction member.

Downhill ski with traction device

A vibratory plow used for laying pipe or electrical cable in the ground is provided with an improved V-shaped oscillating blade. The V-shaped blade has two blade arms that are not connected at their lower ends, so that each blade is free to move in an oscillatory path in the plane of the blade without interference from and independently of the other blade arm.

Growing community of inventors

Corrales, NM, United States of America

Lemna J Hunter