Texas Instruments Corporation

Leigh Ann Files

Duane Scott Dewald

Terry Alan Bartlett

Simon Joshua Jacobs

Robert H Taylor

Charles E Primm

Bruce E Gnade

Thomas J Aton

Kenneth G Vickers

Walter Marvin Duncan

Chi-Cheong Shen

Roger S Carver

Device and method for an antireflective coating to improve image quality in an image display system. A preferred embodiment comprises a first high refractive index layer overlying a reflective surface of an integrated circuit, a first low refractive index layer overlying the first high refractive index layer, a second high refractive index layer overlying the first low refractive index layer, and a second low refractive index layer overlying the second high refractive index layer. The alternating layers of high refractive index material and low refractive index material form an optical trap, allowing light to readily pass through in one direction, but not so easily in a reverse direction. The dual alternating layer topology improves the antireflective properties of the antireflective layer and permits a wide range of adjustments for manipulating reflectivity and color point.

Antireflective coating

An image system comprises a light valve and an image capturing unit. The light valve comprises an array of individually addressable pixels capable of generating an image. The image capturing unit comprises a detector having an array of detector pixels capable of capturing images. The detector pixels are correlated with the light valve pixels.

Light valve projection of visible image correlated with non-visible image

The improved method for microscopic measurement of electrical characteristics comprises a standard atomic force microscope (AFM). The AFM includes a pointed, conductively coated tip attached to one end of a softly compliant cantilever arm, also capable of conducting electricity. The other end of the cantilever arm is attached to the top of a piezo-electric z-axis driver which will raise and lower the cantilever arm as the AFM tip is scanned across the surface of a sample. A piezo-electric X-Y scanstage controller may also be provided and connected to the bottom of the z-axis driver. The X-Y scanstage is preferably capable of scanning the movement of the entire system including the Z-axis driver, cantilever arm and AFM tip.

Method and apparatus for measurement of microscopic electrical characteristics

A stylus location system comprises a field emission device having an anode plate 32 and an emitter plate 2, and a plurality of piezoelectric point elements 34, 42 coupled to the anode plate. The piezoelectric point elements 34, 42 are capable of transforming electrical energy into ultrasonic energy and transforming ultrasonic energy into electrical energy. A stylus 30 is also coupled to the anode plate 32 and circuitry 36, 46, 48 is coupled to the piezoelectric point elements 42 for determining the position of the stylus 30. The circuitry 36 may also send a video data signal to the emitter plate 2 in response to the position determination.

Determination of pen location on display apparatus using piezoelectric

A method for generating coordinate signals in conjunction with a surface of a field emission device having a cathode plate 2 coupled to an anode plate 32 comprises the steps of providing a first ultrasonic wave packet to the anode plate 32, receiving with a stylus 30 positioned proximate to the anode plate 32 the first ultrasonic wave packet, and then transmitting to the anode plate 32 with the stylus 30 a second ultrasonic wave packet responsive to the first ultrasonic wave packet. Next, receiving from the anode plate 32, with a plurality of piezoelectric point elements 44, the second ultrasonic wave packet, and then determining an x-position and y-position 35 of the stylus 30 responsive to the received second ultrasonic wave packet.

Method for determining pen location on display apparatus using

A method of fabricating an anode plate 18 for use in a field emission device comprises the steps of providing a transparent substrate 20 and depositing a layer of a transparent, electrically conductive material 24 on a surface of the substrate. Next, portions of the layer of conductive material 24 are removed to form regions of the conductive material. Luminescent material 26 is then applied on the conductive regions and an outer portion 27 of at least some of the particles of the luminescent material are thereafter removed.

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Richardson, TX, United States of America

Leigh Ann Files