Shenzhen Goodix Technology Co., Ltd.

Leigang Cheng

Songjin Zhong

Dafei Wen

Enqi Fu

A method for measuring an intensity of ambient light at an electronic device, and a electronic device and a chip are provided. The electronic device includes a screen, and the screen is configured to be deemed at a dimming frequency. The method includes the following. Mixed light including the ambient light and screen leakage light is collected. A DC mean value of the mixed light is obtained. A DC mean value of the screen leakage light is obtained. A DC mean value of the ambient light is determined by subtracting the DC mean value of the screen leakage light from the DC mean value of the mixed light. The DC mean value of the ambient light is indicative of the intensity of the ambient light.

Method for measuring intensity of ambient light at electronic device, electronic device, and chip

Embodiments of the present application provide a force detection method, a force detection apparatus and an electronic terminal thereof. The force detection method includes: acquiring an output electrical signal of a voltage dividing capacitor formed between a driving electrode and a force sensing electrode, and an output electrical signal of a force detecting capacitor formed between the force sensing electrode and a reference electrode, determining force feature data when a force is applied to the force sensing electrode based on the output electrical signal of the voltage dividing capacitor and the output electrical signal of the force detecting capacitor. Based on the present application, the force detection model is simplified, the voltage variation amount is increased, the impacts caused by environment changes to the force performance are mitigated or eliminated, and environment self-calibration and self-calibration of an initial gap between the force sensing electrode and the reference electrode are implemented.

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Shenzhen, China

Leigang Cheng