Contemporary Amperex Technology Co., Ltd.

Jiangsu Contemporary Amperex Technology Limited

Lei Song

Kun Liu

Guangcheng Zhong

This application relates to a mark quality inspection method and apparatus, a computer device, and a storage medium. The method includes: acquiring a marked-product image obtained by photographing a marked product upon completion of a marking operation on a product; performing image identification on the marked-product image to obtain a mark quality identification result of an identification code in the marked-product image; and outputting a first indication signal under a condition that the mark quality identification result is normal, where the first indication signal is used to indicate that the marked product flows to a process subsequent to the marking operation. In embodiments of this application, mark quality problems can be found in a timely manner, reducing cases of undesirable mark quality and defectiveness of mass-produced products.

Growing community of inventors

Changzhou, China

Lei Song