Sun Microsystems, Inc.

Oracle America, Inc.

Leesa Noujeim

Istvan Novak

David Hockanson

Bidyut Kanti Sen

A stable power, low electromagnetic interference (EMI) apparatus and method for connecting electronic devices and circuit boards is disclosed. The apparatus involves a capacitor which includes a body member, a set of power terminals and a set of ground terminals connected to the top of the body member. The set of power terminals and the set of ground terminals alternate one with another. As a result of this configuration, a high inductance on the PCB side is achieved. The capacitor further includes a set of terminals connected to the bottom of the body member and includes metal planes within the body member. The metal planes are positioned to electrically connect either the set of power terminals or the set of ground terminals to the set of terminals.

Power integrity circuits with EMI benefits

A printed circuit board (PCB) is provided. The PCB includes a signal layer, a first reference plane defined adjacent to a first side of the signal layer, and a via passing through the signal layer and the first reference plane. The first side of the signal layer is either above the signal layer or below the signal layer. The via is configured to accept an electrical signal to be routed on the signal layer. The inner area of the first reference plane up to the via is capable of being eliminated.

Method, system, and apparatus for reducing transition capacitance

A method for analyzing input output (I/O) pin arrangements to determine the effect of differential pair and power and ground pin placement on signal quality which includes constructing an array of pins, arranging a plurality of differential pairs within the array of pins to provide a pin arrangement, exciting each of the differential pairs within the pin arrangement, monitoring coupled noise on other differential pairs within the pin arrangement, and analyzing the pin arrangement based upon the monitoring.

Conductor arrangement for reduced noise differential signalling

A method for testing a core power distribution system for an integrated circuit chip which includes arranging a plurality of experiments for an integrated circuit chip, performing the plurality of experiments for the integrated circuit chip over a range of frequencies over a range of power distribution system impedances, generating a schmoo diagram for each of the plurality of experiments, and analyzing the schmoo diagrams to determine whether the core power distribution system functions is acceptable at a particular frequency.

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Sunnyvale, CA, United States of America

Leesa Noujeim