Rutgers, the State University of New Jersey

Ontash & Ermac, Inc.

Lee Slater

Dean Pappas

Frank Curatola

Donald V Le Roy

Dimitrios Ntarlagiannis

Konstantin Evdokimov

A system for spectral induced polarization measurement of a formation is provided. The system provides an intelligent module to be utilized in performing spectral induced polarization (SIP) measurements for geophysical studies or otherwise. The system includes a instrument that includes a housing configured to be inserted into a surface opening. The housing houses a signal generator that generates an excitation signal. A drive electrode directs the excitation signal into the material adjacent the housing. A plurality of electrodes sense the voltage and/or current in the material adjacent the housing and a processor processes the sensed voltage and/or current to measure a property of the material. The system also provides a configuration in which a plurality of instruments configured for spectral induced polarization measurements are interconnected to provide communication, synchronization, a common reference signal or power.

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Portland, ME, United States of America

Lee Slater