American Science and Engineering, Inc.

Thermo Niton Analyzers LLC

Other

Thermo Scientific Portable Analytical Instruments Inc.

Niton Corporation

Massachusetts Institute of Technology

Eaton Corporation

Thermo Niton Analyzer LLC

Thermo Fisher Scientific Gmbh

Lee Grodzins

Peter John Rothschild

William L Adams

Jeffrey R Schubert

Martin Rommel

Anatoli Arodzero

Michael E Dugas

Omar Al-Kofahi

Dan-Cristian Dinca

Joseph Callerame

John Pesce

Rajen Sud

Kenneth P Martin

Hal Grodzins

Roderick D Swift

Alex Chalmers

Louis W Perich

Anthony Honnellio

Marvin Farley

Robert F Dillon

Peter H Rose

Jeffrey M Denker

Aaron Judy Couture

Mark A Hamilton

Stanislaw Piorek

Alexander Chalmers

Ravisekhar Yellepeddi

Stephen I Shefsky

Suzhou Huang

Paul R Estabrooks

William Wade Sapp, Jr

Pratheev Sreetharan

Charles G Parsons

Dan-Christian Dinca

Charles G Parson

Stephanie Melikian

Jonathan Edward Everett

William Adams

Peter Rothschild

Jeffrey Schubert

Paul Estabrooks

Methods and an x-ray source for sweeping an x-ray beam across an object of inspection. A beam of electrons is emitted by a cathode, while a sweep controller applies a signal to a beam controller in a prescribed path on an anode, thereby causing an x-ray beam to be emitted from an aperture disposed at one apex of a snout of variable length. The aperture may be a Rommel aperture that allows for forming a scanning x-ray of desired size and flux independently of the angle at which the beam is emitted. Scanning rate may be varied during the course of a scan. Multiple x-ray beams may be formed simultaneously, where one beam is inside a conveyance while the other is outside the conveyance, for example.

Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning

Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.

Hand-held X-ray detection system using wavelength-shifting fiber-coupled scintillation detectors

Systems and methods for detecting clandestine fissile or radioactive material on the basis of emitted radiation and particles (such as neutrons and alpha particles) arising from within the material. Emission by the fissile or radioactive material is detected in conjunction with a conventional x-ray imaging system that includes an external source of illuminating penetrating radiation, at least one detector configured to detect at least the penetrating radiation and to generate a detector signal, and a processor configured as a detector signal discriminator to generate an output indicating whether the detector signal is triggered by an origin other than illuminating penetrating radiation. Active and passive modes of detection are described by some embodiments. Other embodiments are directed toward neutron detection, gamma ray detection with energy resolution, and designs of detectors to enhance the detection of clandestine nuclear material.

Radiation threat detection

Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors

An adjustable collimator for shaping a beam of particles, such as for purposes of inspecting contents of a container. The adjustable collimator has an obscuring element substantially opaque to passage of the particles in a propagation direction that is radial with respect to the axis of rotation of a ring of apertures. A gap in the obscuring element may be characterized by a length taken along a long dimension and a jaw spacing taken along narrow dimension, and at least one of the length of the gap and the jaw spacing is subject to adjustment, either manual or automatic. The adjustable collimator may be disposed either inside or outside the ring of apertures, and, in some embodiments, the jaw spacing may be a function of distance along the long dimension relative to an edge of the gap.

Adjustable-jaw collimator

A detector and methods for inspecting material on the basis of scintillator coupled by wavelength-shifting optical fiber to one or more photo-detectors, with a temporal integration of the photo-detector signal. An unpixelated volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides. This geometry provides for efficient and compact detectors, enabling hitherto unattainable geometries for backscatter detection and for energy discrimination of incident radiation. Additional energy-resolving transmission configurations are enabled as are skew- and misalignment compensation.

X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors

Apparatus for interrupting and/or scanning a beam of penetrating radiation, such as for purposes of inspecting contents of a container. A source, such as an x-ray tube, generates a fan beam of radiation effectively emanating from a source axis, with the width of the fan beam collimated by a width collimator, such as a clamshell collimator. An angular collimator, stationary during the course of scanning, limits the extent of the scan, and a multi-aperture unit, such as a hoop, or a nested pair of hoops, is rotated about a central axis, and structured in such a manner that the total beam fluence incident on a target is conserved for different fields of view of the beam on the target. The central axis of hoop rotation need not coincide with the source axis.

Versatile x-ray beam scanner

A versatile beam scanner for generating a far-field scanned pencil beam, and, alternatively, a far-field pencil beam. An angle selector limits the angular extent of an inner fan beam emitted by a source of penetrating radiation. The source and angle selector may be translated, along a direction parallel to a central axis of a multi-aperture unit, in such a manner as to generate a scanned far-field pencil beam, when rings of apertures are interposed between the source and an inspected target, or, alternatively, a far-field fan beam, when no ring of apertures is interposed.

Versatile beam scanner with fan beam

Apparatus for interrupting and/or scanning a beam of penetrating radiation, such as for purposes of inspecting contents of a container. A source, such as an x-ray tube, generates a fan beam of radiation effectively emanating from a source axis, with the width of the fan beam collimated by a width collimator, such as a clamshell collimator. An angular collimator, stationary during the course of scanning, limits the extent of the scan, and a multi-aperture unit, such as a hoop, or a nested pair of hoops, is rotated about a central axis, and structured in such a manner that beam flux incident on a target is conserved for different fields of view of the beam on the target. The central axis of hoop rotation need not coincide with the source axis.

Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector () in accordance with the elemental composition of a sample and/or energy resolving requirements. X-rays () are directed from a source () onto a sample () and the radiation () responsively emitted from the sample (e.g., fluoresced radiation characteristic of the sample's elemental composition) and detected by an x-ray detector () that generates pulses representative of the energy and intensity of the incident radiation. Based upon initial analysis of elemental composition, the shaping time and/or other pulse processing parameter (s) are set to optimize count rate subject to constraints of energy resolution in a spectral region of interest.

Dynamic shaping time modification in X-ray detectors

A method of operating an x-ray fluorescence (XRF) analyzer to automatically suppress sum-peaks is disclosed. The method includes irradiating a sample to acquire an initial energy spectrum. The energy spectrum is processed to identify a sum-peak that interferes with a characteristic fluoresced peak of an element of interest. A filter is positioned in the emitted radiation path to attenuate radiation that contributes to the identified sum-peak, and a filtered energy spectrum is acquired. In certain embodiments, the filtered energy spectrum is acquired only when a limit of detection (LOD) of an element of interest calculated from the initial energy spectrum does not satisfy a targeted objective.

Automated sum-peak suppression in an X-ray fluorescence analyzer

A thermal neutron monitor includes at least one neutron scintillator sheet interposed between light guides. Scintillation light emitted in opposite transverse directions is captured by the light guides and conveyed to a common detector. The sandwiched geometry of the monitor avoids the need to provide multiple detectors and permits construction of a relatively inexpensive, compact monitor.

Compact thermal neutron monitor

An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.

Localization of an element of interest by XRF analysis of different inspection volumes

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Lexington, MA, United States of America

Lee Grodzins