Hewlett-Packard Company

Leanne C Pelzel

Robert A Slutz

Tracy L Sayre

A hybrid test fixture is described that utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The hybrid test fixture of the present invention also utilizes standard spring probes and long wirewrap posts or long wirewrap wires in order to probe standard-access test targets. The hybrid test fixture of the present invention also utilizes spring probes, a probe-mounting plate, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. Accordingly, the hybrid test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing of standard-access test targets.

Growing community of inventors

Boulder, CO, United States of America

Leanne C Pelzel