Growing community of inventors

Austin, TX, United States of America

Lawrence R Dunn

Average Co-Inventor Count = 4.04

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 37

Lawrence R DunnSidlgata V Sreenivasan (6 patents)Lawrence R DunnShrawan Singhal (6 patents)Lawrence R DunnMichael Gostein (5 patents)Lawrence R DunnOvadia Abed (5 patents)Lawrence R DunnStan Faullin (5 patents)Lawrence R DunnWilliam Stueve (3 patents)Lawrence R DunnParas Ajay (3 patents)Lawrence R DunnMichael Cullinan (2 patents)Lawrence R DunnAseem Sayal (2 patents)Lawrence R DunnMark McDermott (2 patents)Lawrence R DunnVipul Goyal (2 patents)Lawrence R DunnRussell J Apfel (1 patent)Lawrence R DunnOfodike A Ezekoye (1 patent)Lawrence R DunnRobert N Dunn (1 patent)Lawrence R DunnJason Schneider (1 patent)Lawrence R DunnNaoum Gitnik (1 patent)Lawrence R DunnLawrence R Dunn (12 patents)Sidlgata V SreenivasanSidlgata V Sreenivasan (143 patents)Shrawan SinghalShrawan Singhal (18 patents)Michael GosteinMichael Gostein (16 patents)Ovadia AbedOvadia Abed (15 patents)Stan FaullinStan Faullin (7 patents)William StueveWilliam Stueve (13 patents)Paras AjayParas Ajay (11 patents)Michael CullinanMichael Cullinan (8 patents)Aseem SayalAseem Sayal (6 patents)Mark McDermottMark McDermott (6 patents)Vipul GoyalVipul Goyal (3 patents)Russell J ApfelRussell J Apfel (44 patents)Ofodike A EzekoyeOfodike A Ezekoye (5 patents)Robert N DunnRobert N Dunn (2 patents)Jason SchneiderJason Schneider (2 patents)Naoum GitnikNaoum Gitnik (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. University of Texas System (6 from 5,444 patents)

2. Atonometrics, Inc. (4 from 5 patents)

3. Other (2 from 832,680 patents)


12 patents:

1. 12424498 - System and method for modification of substrates

2. 12009247 - Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-place

3. 11762284 - Wafer-scale programmable films for semiconductor planarization and for imprint lithography

4. 11669009 - Roll-to-roll programmable film imprint lithography

5. 11469131 - Heterogeneous integration of components onto compact devices using moire based metrology and vacuum based pick-and-place

6. 10562626 - Tandem wing aircraft with variable lift and enhanced safety

7. 9800202 - Soiling measurement system for photovoltaic arrays

8. 9718096 - Programmable deposition of thin films of a user-defined profile with nanometer scale accuracy

9. 9564853 - Soiling measurement system for photovoltaic arrays

10. 9413174 - I-V measurement system for photovoltaic modules

11. 9347827 - System for field measurement and calibration of photovoltaic reference devices

12. 8773021 - Light soaking system for photovoltaic modules

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as of
12/5/2025
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