University of Illinois

Ohio State Innovation Foundation

Nes Technologies, Inc

Lawrence A Bergman

Alexander F Vakakis

Seok Kim

Hanna Cho

Sajith M Dharmasena

D Michael McFarland

A cantilever system for use in an atomic force microscope (AFM) is disclosed. The cantilever system comprises a base cantilever portion and a paddle connected to the base cantilever portion with one end free to move relative to the base cantilever portion. The base cantilever portion has an effective bending stiffness, k, and the paddle has an effective bending stiffness, k. The ratio of the effective bending stiffness, k, to the bending stiffness, k, is at least greater than 4. Such a cantilever system provides a stable, i.e., invariant contact resonant frequency, independent of the changes in the local contact stiffness.

Cantilever for atomic force microscopy

A nonlinear attachment induces energy to be transferred and/or to be pumped from a primary system or primary structure to the nonlinear attachment. The nonlinear attachment is an essentially nonlinear device and functions as a nonlinear energy sink. The nonlinear attachment attaches to the primary system or primary structure as a module and does not require connection to a ground. The energy is irreversibly pumped from the primary system or primary structure to the nonlinear attachment during transient resonance capture between the nonlinear attachment and the primary system or primary structure. The nonlinear attachment attenuates the energy of the primary system or primary structure. The nonlinear attachment locally confines the energy and/or dissipates the energy through a passive means and/or an active means.

Device, a system and a method for transferring vibrational energy

Growing community of inventors

Champaign, IL, United States of America

Lawrence A Bergman