Allegro Microsystems, LLC

Lautaro Casella

Octavio H Alpago

Nicolas Rigoni

Jesse Lapomardo

Lucas Intile

Florencia Ferrer

Ignacio Lesser

In one aspect, a magnetic field sensor includes a magnetic field sensing element configured to detect changes in a magnetic field caused by a target and an encoder configured to process signals originating from the magnetic field element. The encoder is configured to generate a first output signal and a second output signal. In a non-fault state, the first and second output signals are 90 electrical degrees out of phase from one another, and in a fault state, the first and second output signals are in phase with each other.

Magnetic field sensor with fault reporting

An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.

Fault test circuit using launch-off-shift scan

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Lautaro Casella