Fei Comapny

Laurent Roussel

Johannes Jacobus Lambertus Mulders

Wilhelmus Michael Busing

Johannes Mulders

Wilhelmus Busing

The invention relates to a method for obtaining images from slices of a specimen, the method comprising: repeatedly obtaining an image of the surface layer of the specimen () and removing the surface layer of the specimen, thereby bringing the next slice to the surface; characterized in that after at least one of the removals of a surface layer the specimen is exposed to a staining agent. This method is especially suited for use in a particle-optical instrument equipped with both a scanning electron microscope column () and a focused ion beam column (). The specimen can e.g. be stained in situ by admitting a gas, such as OsO4 (osmiumtetroxide), to the specimen. This method also makes it possible to perform differential staining by first making an image of the specimen exposed to a first staining agent, and subsequently making an image of the specimen when it is additionally stained by a second staining agent.

Method for obtaining images from slices of specimen

The invention relates to a method for obtaining images from slices of a specimen, the method comprising: This method is especially suited for use in a particle-optical instrument equipped with both a scanning electron microscope column () and a focused ion beam column (). The specimen can e.g. be stained in situ by admitting a gas, such as OsO(osmiumtetroxide), to the specimen. This method also makes it possible to perform differential staining by first making an image of the specimen exposed to a first staining agent, and subsequently making an image of the specimen when it is additionally stained by a second staining agent.

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Eindhoven, Netherlands

Laurent Roussel