Centre National De La Recherche Scientifique

Electricite De France

Ecole Polytechnique

Total

Electricité De France—edf

Institut Photovoltaique D'ile-de-france

Centre National De La Recherche Scientifique-cnrs

Total Se

Laurent Lombez

Jean-François Guillemoles

Jean-Luc Pelouard

Daniel Lincot

Nicolas Paul

Myriam Paire

Stephane Collin

Stéphane Collin

Amaury Delamarre

Adrien Bercegol

Daniel Ory

A time-resolved hyper-spectral imaging system for imaging a sample, includes a radiation source suitable for illuminating the sample repeatably, a first optical system configured to form an image I of the sample on a spatial light modulator forming a transmission or reflection mask P, a processor connected to the spatial light modulator and configured to make the transmission or reflection mask P vary for each repetition of the illumination, a second optical system suitable for focusing the radiation transmitted or reflected by the spatial light modulator so as to form, in its image focal plane, a partial image S=P&#xb7;I; the imaging system being wherein it comprises: a dispersive device comprising a slit placed in the image focal plane of the second optical system, the dispersive device being suitable for spatially splitting the various wavelengths of the radiation transmitted or reflected by the spatial light modulator; a streak camera arranged so as to be illuminated by the radiation issuing from the dispersive device and configured to acquire a plurality of time-resolved partial images of the sample, the images being associated with respective and different transmission or reflection masks P, the streak camera being connected to the processor and the processor also being configured to combine the partial images of the sample so as to construct a 4D image cube Iforming an image resolved in time and in wavelength of the sample; and corresponding time-resolved hyper-spectral imaging method for imaging a sample.

Time-resolved hyper-spectral single-pixel imaging

A method for analyzing the crystal structure of a polycrystalline semiconductor material is described. According to one embodiment, the method includes exciting the material to make the material emit a luminescent signal, detecting, at each point of a mesh in a preset spatial region of the material, the luminescent signal at a variable polarization angle, in a frequency band of width greater than or equal to the width of the bandgap of the material, estimating, at each point of the mesh in the preset spatial region of the material, from the signal detected for said point of the mesh, a data characteristic of the modulation of the luminescent signal, modelled by a sum of sine waves, as a function of the polarization angle, and representing the characteristic data over all of the points of the mesh in the preset spatial region.

Method for analysing the crystal structure of a polycrystalline semiconductor

A method for fabricating a photosensitive device, comprising: a first step of preparing, on a substrate, at least a first photosensitive portion, active within a range of wavelengths, the first portion being surrounded by a second portion that is inactive. A material, covering the first portion, is selectively arranged into a hydrophilic layer by an electrochemical process. The second portion comprises a hydrophobic material on an upper surface opposite the substrate. The method further comprises the following steps: spraying on the upper surfaces of the first and second portions a liquid comprising a transparent material, and forming a converging lens containing the material, above the first portion.

Method for fabricating a photosensitive device

Growing community of inventors

Nanterre, France

Laurent Lombez