Texas Instruments Corporation

Laurence D Schultz

Neal T Murphy

David A Stark

The present invention provides a system () for conditioning multi-component slurries utilized in chemical mechanical polishing (CMP) of semiconductor wafers (). The system provides a first slurry component (), and a second slurry component (). A conditioning component () has first and second inlets, and an outlet operatively coupled to a dispensing system (). First and second flow control components () are operably intercoupled between the first and second inlets and the first and second slurry components, respectively. The system further provides a megasonic energy source (), adapted to generate an energy field () across the conditioning component. A conveyance component () conducts the slurry components from the inlets through the energy field, and delivers a final mixture () of multi-component slurry to the outlet.

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Richardson, TX, United States of America

Laurence D Schultz