Growing community of inventors

Newark, DE, United States of America

Lauren J Hayward Schaefer

Average Co-Inventor Count = 3.00

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 13

Lauren J Hayward SchaeferDavid G Terry (6 patents)Lauren J Hayward SchaeferBernadette Alexia Carter (3 patents)Lauren J Hayward SchaeferCesar Augusto Wong (3 patents)Lauren J Hayward SchaeferRobert Retchless (3 patents)Lauren J Hayward SchaeferJoseph C Leong (3 patents)Lauren J Hayward SchaeferPratyush Dhruv (3 patents)Lauren J Hayward SchaeferCorrie H Y Kwan (2 patents)Lauren J Hayward SchaeferCorrie H Kwan (1 patent)Lauren J Hayward SchaeferLauren J Hayward Schaefer (9 patents)David G TerryDavid G Terry (7 patents)Bernadette Alexia CarterBernadette Alexia Carter (84 patents)Cesar Augusto WongCesar Augusto Wong (30 patents)Robert RetchlessRobert Retchless (13 patents)Joseph C LeongJoseph C Leong (6 patents)Pratyush DhruvPratyush Dhruv (3 patents)Corrie H Y KwanCorrie H Y Kwan (2 patents)Corrie H KwanCorrie H Kwan (4 patents)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (9 from 164,108 patents)


9 patents:

1. 10025697 - Generation of automated unit tests for a controller layer system and method

2. 10001989 - Verifying source code in disparate source control systems

3. 9898281 - Verifying source code in disparate source control systems

4. 9870304 - System for verifying historical artifacts in disparate source control systems

5. 9747098 - Verifying source code in disparate source control systems

6. 9697106 - Method for verifying historical artifacts in disparate source control systems

7. 9430748 - Verifying historical artifacts in disparate source control systems

8. 9400737 - Generation of automated unit tests for a controller layer system and method

9. 9400738 - Generation of automated unit tests for a controller layer system and method

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12/3/2025
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