Rika Electronics International, Inc.

Rika Denshi America, Inc.

Kita USA

Larre H Nelson

John M Winter

John C Bergeron

Lourie M Sarcione

Theresa R Souza

Yoshihide Kimura

A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.

Biasing method and device construction for a spring probe

A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Apparatus for interfacing electronic packages and test equipment

Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.

Electrical test probes, methods of making, and methods of using

An electrical socket ( ) mounts a plurality of electrical contact probes ( ) for providing an electrical connection between terminals of an electronic package ( ) received in a seat ( ) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip ( ) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface ( ) for interengagement with a removable retainer member of the socket.

Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition

A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.

Growing community of inventors

Attleboro, MA, United States of America

Larre H Nelson