Amazon Technologies, Inc.

Larisa Goffman-Vinopal

Yaniv Shapira

Anat Arbely

Udi Sherel

Vladimir Kaplunov

Methods and devices for determining integrated circuit (IC) device degradation over time are provided. Transistors are the basic building blocks of IC devices. The degradation of the transistors in IC devices over time leads slowly to decreased switching speeds. To monitor the condition of an IC device as it ages, oscillator circuitry operating at switching frequencies of various circuits in the IC device may be included and monitored for changes in switching frequency over time. A degraded condition of the IC device may be determined when the change in switching frequency exceeds a threshold value.

Digital ring oscillator for monitoring aging of silicon devices

A method for managing clock frequency in a multi-core integrated circuit includes determining a minimum allowable operating clock frequency and a maximum allowable operating clock frequency for an integrated circuit having a plurality of processor cores. A plurality of clock sources is configured to provide a corresponding plurality of clock frequencies between the minimum allowable operating clock frequency and the maximum allowable operating clock frequency. A total number of active processor cores is determined. If it is determined that all of the plurality the processor cores are active, all active processor cores are operated at the minimum allowable operating clock frequency. If it is determined that the total number of active processor cores is lower than a threshold number, the clock frequency of one or more active processor cores is increased based on available electrical current budget.

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Zichron Yaakov, Israel

Larisa Goffman-Vinopal