Asm Technology Singapore Pte Ltd

Asm Assembly Automation Limited

Lap Kei Chow

Chi Wah Cheng

Ching Man Tsui

Hui Fai Ho

Jiangwen Deng

Wui Fung Sze

Hoi Shuen Tang

Chi Hang Leung

Chi Hang Kwok

Sze Leong Lai

Cam Nguyen Ronald Ngo

Man Kin Leung

Cam Nguyin Ngo

Zhuanyun Zhang

An apparatus for inspecting a semiconductor die bonded on a top surface of a substrate uses an optical assembly including an image sensor and an optical system for conducting the inspection. The optical assembly is tilted at an oblique angle with respect to the top surface of the substrate, and is arranged such that its depth of focus is substantially perpendicular to the top surface of the substrate for inspecting at least one side wall of the semiconductor die.

Apparatus and method inspecting bonded semiconductor dice

An apparatus for supporting a workpiece during processing of the workpiece is disclosed. The apparatus comprises: a chassis having a vacuum chamber that is connectable to a vacuum source; a supporting device rotatable relative to the chassis, the supporting device having a hollow compartment and a supporting surface for holding the workpiece; and at least one sealing device arranged between the chassis and the supporting device, to provide an air-tight seal between the chassis and the supporting device while allowing for rotation of the supporting device with respect to the chassis, so as to form a vacuum passage extending from the supporting surface of the supporting device through the hollow compartment of the supporting device and the vacuum chamber of the chassis to the vacuum source, to thereby hold the workpiece to the supporting surface of the supporting device during processing of the workpiece.

Apparatus and method for supporting a workpiece during processing

A laser processing method is disclosed, comprising the steps of: directing a laser beam to a workpiece; and effecting a relative motion between the laser beam and the workpiece. In particular, the step of directing the laser beam to the workpiece comprises focusing the laser beam within the workpiece until an internal damage forms within the workpiece and a crack propagates from the internal damage to at least one surface of the workpiece to form a surface crack on the workpiece. Further, the step of effecting the relative motion between the laser beam and the workpiece is such that the surface crack on the workpiece propagates along a line of separation on the workpiece. A laser processing apparatus is also disclosed.

Laser processing method and apparatus

A method of configuring a dicing device, which dices along a cutting line of a workpieceaccording to a dicing step, is disclosed. Numerical input of a dicing order of the dicing deviceto dice a workpieceis time-consuming and prone to errors. The disclosed method comprises the step of depicting a graphical user interface, which includes a layoutof the workpiecethat further includes a plurality of cut lines relating to respective cutting lines along the workpiece. The disclosed method further comprises the step of graphically contacting a cut line from the layoutthrough a user-interface device, to allow selection of the cut line before the selected cut line is assigned to the dicing step of the dicing device. By providing the plurality of cut lines in the layoutthat are graphically contactable through the user-interface device, the method advantageously allows an easier process of configuring the dicing step of the dicing device. Also disclosed are a dicing apparatus for dicing a workpiece, as well as a computer-readable medium having a computer program for instructing a computer to perform the disclosed method.

Method of configuring a dicing device, and a dicing apparatus for dicing a workpiece

A laser processing apparatus for cutting substrates comprises a laser head for generating a laser beam and first and second work holders on which substrates are mountable. A diverter positioned along a path of the laser beam is operative to selectively direct the laser beam towards a first substrate mounted on the first work holder to cut the first substrate, or towards a second substrate mounted on the second work holder to cut the second substrate, so that contemporaneous operations may be conducted on one substrate while the other substrate is being cut.

Laser processing apparatus

A method for determining virtual cutting lines for a substrate prior to its singulation is provided whereby the substrate comprises first and second rows of alignment marks which are substantially parallel to each other such that a pair of alignment marks each from the first and second rows of alignment marks is configured for determining a position of a virtual cutting line. The method comprises the steps of positioning the first row of alignment marks along a relative motion path of a first camera and positioning the second row of alignment marks along a relative motion path of a second camera. While the substrate is being moved relative to the first and second cameras along the respective relative motion paths without stopping, the first and second cameras capture images of multiple pairs of alignment marks from the first and second rows of alignment marks during such motion. Thereafter, the position of each virtual cutting line is determined from the images of each pair of alignment marks along the first and second rows of alignment marks relating to the virtual cutting line and stored in a storage device for use during singulation.

Alignment method for singulation system

An apparatus supports, during a testing operation, a leadframe formed with at least one row of non-singulated semiconductor devices. The apparatus includes a main body and a leadframe support member, and the leadframe support is formed with at least one groove for receiving semiconductor devices such that in use leads extending from the semiconductor devices lie on a surface of the support member.

Apparatus for supporting semiconductor devices during testing

The present invention provides apparatus for supporting during a testing operation a leadframe formed with at least one row of non-singulated semiconductor devices. The apparatus comprises a main body and a leadframe support member, and the leadframe support member is formed with at least one groove for receiving semiconductor devices such that in use leads extending from said devices lie on a surface of said support member. The invention also relates to a system for transporting devices to and from a test probe head.

Growing community of inventors

Hong Kong, China

Lap Kei Chow