International Business Machines Corporation

Lanphuong Thi Pena

Michael G Lisanke

Huizong Lu

Ali Reza Taheri

Andrew Ching Tam

Peter Michael Baumgart

Pieter J Kerstens

Hong S Seing

Michael Barenboim

Peter P Chrusch

Benny Michael Harper

Eric V Schnetzer

Alan David Dorundo

Benjamin Karni

Kenneth Wayne Watts

Samuel Sheung-Lok So

Akram Aref Bou-Ghannam

Richard J McCormick

Benjamin Kami

Darell Smith Whitaker

Apparatus for inspecting the surface of a sample includes a wide scanning interferometer, which is used to locate defects, or anomalies in the surface, and a narrow scanning interferometer, which is used to develop profiles of individual defects found by the narrow scanning interferometer. The sample may be driven in rotation about an axis, while the interferometers are independently moved radially to the axis.

Optical apparatus for rapid defect analysis

A disk texturing process uses a single pulsed laser to texture disks within a first group, which are carried through the texturing process on a first spindle assembly, and from a second group, which are carried through the texturing process on a second spindle assembly. Preferably, disks from the first group are textured alternately with disks in the second group. A first level of least one texturing parameter is stored for use only as the process is applied to disks from the first group, while a second level of the same texturing parameter is stored for use only as the process is applied to disks from the second group. These levels may be derived from measurements of textured spots made with interferometric devices forming portions of a texturing station.

Laser texturing apparatus with dual laser paths having an independently

An interferometer is used to locate and examine defects in a test surface of a test specimen. Defects are first located as the test surface is driven past the objective of the interferometer at a constant speed, with a darkfield interferogram being examined as it flows across a row of CCD elements. During this process, the location of each defect is stored. Next, the test specimen is sequentially moved into the locations at which static measurements are made using an area array of CCD elements. During these measurements, the phase angle relationship of the interferometer is varied so that heights of surface segments may be calculated. If some to these segments are located more than a quarter wave length of the interferometer light source from the surface at which the darkfield is established, a process is used to perform height corrections for segments within transition boundaries.

Apparatus and method for storing interferometric images of scanned

Inspection apparatus for determining the profile of textured spots extending in a pattern along a surface of a magnetic disk includes an interferometer which illuminates first and second, adjacently disposed test spots on the surface. The disk and the interferometer are moved, relative to one another, so that one of the test spots traverses the textured spots in the pattern while the other test spot is moved along a flat portion of the disk surface. In one embodiment, the inspection apparatus is built into the device forming the textured spots, providing feedback controlling the texturing process.

Optical apparatus for inspecting laser texture

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Fort Lauderdale, FL, United States of America

Lanphuong Thi Pena