United Microelectronics Corp.

Lan-Ping Chang

Kun-Ju Li

Po-Cheng Huang

Chun-Tsen Lu

Yu-Ting Li

Fu-Shou Tsai

Wu-Sian Sie

Shih-Ming Lin

I-Lun Hung

A manufacturing method of a semiconductor device is provided. The manufacturing method includes the following steps. A plurality of fin structures are formed in a first area and a second area of a substrate. A first density of the fin structures in the first area is lower than a second density of the fin structures in the second area. A gate dielectric layer is formed on the fin structures. An amorphous silicon layer is formed on the gate dielectric layer and the fin structures in the first area and the second area. Part of the amorphous silicon layer which is disposed in the first area is annealed to form a crystalline silicon layer by a laser. The crystalline silicon layer disposed in the first area and the amorphous silicon layer disposed in the second area are polished.

Manufacturing method of semiconductor device

Growing community of inventors

Kaohsiung, Taiwan

Lan-Ping Chang