Limburgs Universitair Centrum

Imec Vzw

Limburgs Universitaire Campus

Interuniversitair Micro-elektronic Centrum Vzw

Interuniversitair Micro-electronika Centrum Vzw

Lambert Mathias Stals

Ward Aime De Ceuninck

Jean Joseph Roggen

Luc Irena De Schepper

An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.

Method and apparatus for local temperature sensing for use in performing

Method for local temperature sensing for use in performing high

An apparatus and method for determining the reliability of an electronic component by performing measurements which enable the ageing behavior of a parameter of that component to be predicted over time. The parameter measurements are made in-situ within the oven or environment used to control the temperature at which the measurements are made. The oven is controlled so that its temperature is kept stable, thereby permitting very high resolution measurements to be made over a relatively short time span. The temperature stability of the oven ensures that the changes of the electromagnetic parameter to be measured as a result of temperature fluctuations are negligible relative to the changes as a result of the ageing phenomena which occur in the component over time. The high resolution measurements are then used to model the parameter value as a function of time based on a deterministic model of how that parameter of the component varies over the lifetime of the component. The model is extrapolated over time to determine the reliability of the component as it ages. The result of the invention is a reliable prediction of the component's parameter value as a function of time, which enables a user or manufacturer to know when the parameter value will exceed its intended tolerance values, and either fail or cause the device in which it is incorporated to become unreliable.

Apparatus and method for measuring electromagnetic ageing parameter of a

Growing community of inventors

Diepenbeek, Belgium

Lambert Mathias Stals