Xerox Corporation

Lai C Lam

Joseph A Mastrandrea

Robert M Mara

Barbara A Sampath

Patrick O Waller

An apparatus for monitoring and controlling electrical parameter of an imaging surface, the monitoring controlling apparatus including a patch generator for recording a first control patch at a first voltage level and a second control patch at a second voltage level on the imaging surface; electrostatic voltmeter for measuring voltage potentials associated with the first control patch and second control patch. A processor, in communication with the patch generator, calculates the electrical parameters of the imaging surface from the measured voltage potentials from the first and second control patches. The processor determines a deviation between the calculated electrical parameters values and setup values. Then, the processor produces and sends a feedback error signal to the patch generator if the deviation exceed a threshold level. The patch generator records a third control patch at a third voltage level on the imaging surface upon reception of the error signal. The ESV senses the third control patch. The processor calculates the electrical parameters of the imaging surface from the measured voltage potential of the third control patch and determines a correction factor. The charging device, exposure system and developer are adjusted in accordance to the correction factor.

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Webster, NY, United States of America

Lai C Lam