Taiwan Semiconductor Manufacturing Comp. Ltd.

L C Chou

Ru-Gun Liu

Chih-Ming Lai

Jiann-Tyng Tzeng

Chih-Liang Chen

Charles Chew-Yuen Young

Kam-Tou Sio

Wei-Liang Lin

Chin-Yuan Tseng

In an embodiment, a method (of manufacturing fins for a semiconductor device) includes: forming a first layer (on a semiconductor substrate) that has first spacers and etch stop layer (ESL) portions which are interspersed; forming second spacers on central regions of the first spacers and the ESL portions; removing exposed regions of the first spacers and the ESL portions and corresponding underlying portions of the semiconductor substrate; removing the second spacers resulting in corresponding first capped semiconductor fins and second capped semiconductor fins that are organized into first and second sets; each member of the first set having a first cap with a first etch sensitivity; and each member of the second set having a second cap with a different second etch sensitivity; and eliminating selected ones of the first capped semiconductor fins and selected ones of the second capped semiconductor fins.

Method of making semiconductor device which includes Fins

A semiconductor device including fins arranged so that: in a situation in which any given first one of the fins (first given fin) is immediately adjacent any given second one of the fins (second given fin), and subject to fabrication tolerance, there is a minimum gap, Gmin, between the first and second given fins; and the first and second given fins a minimum pitch, Pmin, that falls in a range as follows: (G+(&#x2248;90%)*T1)&#x2264;P&#x2264;(G+(&#x2248;110%)*T1).

Semiconductor device which includes fins and method of making same

A semiconductor device including multiple fins. At least a first set of fins among the multiple fins is substantially parallel. At least a second set of fins among the multiple fins is substantially collinear. For any given first and second fins of the multiple fins having corresponding first and second fin-thicknesses, the second fin-thickness is less than plus or minus about 50% of the first fin-thickness.

Semiconductor device which includes Fins

A method, of manufacturing fins for a semiconductor device which includes Fin-FETs, includes: forming a structure including a semiconductor substrate and capped semiconductor fins, the capped semiconductor fins being organized into at least first and second sets, with each member of the first set having a first cap with a first etch sensitivity, and each member of the second set having a second cap with a second etch, the second etch sensitivity being different than the first etch sensitivity; removing selected members of the first set and selected members of the second set from the structure.

Method of manufacturing fins and semiconductor device which includes fins

A method of forming fins on a substrate is provided. The method comprises depositing first fin spacers comprising first fin spacer material and second fin spacers comprising second fin spacer material on a plurality of locations on a substrate having a hard mask above the substrate's semiconductor material, wherein the first fin spacers comprise desired first fin spacers and dummy first fin spacers and the second fin spacers comprise desired second fin spacers and dummy second fin spacers. The method further comprises forming fins on the substrate under the first fin spacers and the second fin spacers. The fins comprise a plurality of dummy fins and a plurality of desired fins. The dummy fins comprise a plurality of dummy first fins formed under the dummy first fin spacers and a plurality of dummy second fins formed under the dummy second fin spacers. The method further comprises removing the dummy first fin spacers separately from removing the dummy second fin spacers, removing the dummy second fin spacers, and removing the dummy fins without damaging the desired fins.

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Taipei, Taiwan

L C Chou