Samsung Electronics Co., Ltd.

Kyunlae Kim

Young Su Heo

Jaeyoung Park

Kuihyun Yoon

Wonguk Seo

Kyoungchon Kim

Kyoungho Yang

Provided is an optical inspection system including a supporting unit, allowing a target object to be loaded thereon, a light source unit configured to emit a laser beam toward the target object, a light condensing unit collecting scattered light that is scattered at the target object when the laser beam is irradiated onto the target object, and a control unit controlling the light source unit and the light condensing unit and analyzing the scattered light to examine whether there are pollutants on the target object. The supporting unit may include a first supporting unit, on which the target object is disposed, and which is formed of a first material, and a second supporting unit, which is disposed under the first supporting unit and is formed of a second material different from the first material.

Growing community of inventors

Suwon-si, South Korea

Kyunlae Kim