Electro Scientific Industries, Inc.

Kyung Young Kim

Douglas John Garcia

Brian C Johansen

David W Newton

Justin Redd

Jeffrey L Fish

Bruce W Ball

Graham Karam Kim

Locke Lowman

An accessory facilitates loading and unloading of cartridges into a firearm magazine and includes a main body having a top end with a top opening, a bottom end with a bottom opening, a wall portions extending between the top and bottom ends and defining therebetween a body cavity in communication with the top and lower openings and also defining a front opening in communication with the body cavity. A first portion of the body cavity can receive a cartridge from the front opening and a second portion of the body cavity can receive an open end of a portion of a firearm magazine from the bottom opening. A thruster is movably coupled to the main body and mounted to the main body above the top end, and includes a plunger which is movable into and out of the first portion of the body cavity through the top opening.

Universal magazine loading and unloading accessory

Each data point within a two-dimensional code can be represented by a distribution of spots. Each spot can be made small enough to be invisible to the human eye so that the two-dimensional code can be invisible on or within transparent or nontransparent materials. The spots can be spaced at a large distance to increase the signal-to-noise ratio for an optical code reader. A code reader can be adapted to read the spots and determine the data points.

Optical mark reader

A grip mechanism for an end effector includes a grip member configured to be coupled to an effector body. A gripper of the grip member is movable based on movement of the grip member such that the gripper is movable along an engagement path to an engagement position where an object such as a substrate can be retained within a retaining region adjacent to the effector body. End effectors for handling objects incorporating one or more grip mechanisms, and methods of handling an object such as a substrate, are also disclosed.

Apparatus and method for handling a substrate

Recesses (), surface contours, contact tip modifications (), and/or other methods of ensuring pressure between a bottom surface () of a test plate () and top surfaces () of electrical contacts () are employed to enhance cleaning of the top surfaces () of the electrical contacts () to promote reliable measurements of DUTs ().

Vacuum ring designs for electrical contacting improvement

In an electronic testing machine including at least one test module having a plurality of contacts for testing electronic components, the improvement of a contact alignment tool for aligning the contacts is taught. The tool includes a body to be positioned relative to the machine such that the body can be radially indexed along a path to a test position proximate the contacts and a plurality of circuits associated with the body. Each circuit includes at least one output signal connection and at least one open contact station. Each station is defined by at least one open circuit trace pattern and is closed by the contacts when the body is located at the test position and the contacts are properly aligned. A method and apparatus for aligning contacts of an electronic testing machine are also taught.

Contact alignment verification/adjustment fixture

A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.

Method and machine for repetitive testing of an electrical component

A test probe alignment apparatus includes a rotatable &#x3b8; stage that is decoupled from a workpiece positioning stage so that the workpiece positioning stage can move a workpiece in an X-Y plane without moving the &#x3b8; stage, thereby inhibiting vibration in and inertia of the workpiece positioning stage, and improving the speed and accuracy of workpiece movements. The &#x3b8; stage is driven for rotation about an axis substantially perpendicular to the X-Y plane. The rotatable stage supports a carriage adapted for holding a probe card. The carriage rotates in concert with the &#x3b8; stage to thereby align the probe card relative to the workpiece. A Z-stage is operatively engaged with the carriage for moving the carriage along the axis of rotation relative to the workpiece. A computer processor performs coordinate transformations on preprogrammed movement vectors, to adjust for angular misalignment of the workpiece as measured by a position sensor.

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Portland, OR, United States of America

Kyung Young Kim