Samsung Electronics Co., Ltd.

Kyung-dae Kim

Pil-Kwon Jun

Sang-mun Chon

Yun-sik Yang

Min-gyu Kim

Sang-oh Park

Dong-jin Park

Jin-ho Hwang

Il-hyun Sohn

Hyung-sik Hong

Hun-Jung Yi

Hun Cha

Jae-Jun Ryu

June-Ing Gill

Yong-Woo Heo

Bo-yong Lee

Ki-seok Lee

A resist removing composition having a superior capability for removing a resist, polymer, organometallic polymer and etching by-products such as metal oxide, which does not attack underlying layers exposed to the composition and which does not leave residues after a rinsing step. The resist removing composition contains alkoxy N-hydroxyalkyl alkanamide and a swelling agent.

Resist and etching by-product removing composition and resist removing method using the same

The present invention relates to a method and apparatus for automatically measuring the concentration of total organic carbon (TOC) in chemicals and ultra-pure water that are used in a wet etch process. The apparatus includes a sampling line extending from a processing bath, and a pump, for extracting a fluid sample from the processing bath, a buffer for filtering foreign material or air bubbles from the fluid, and an analyzer for analyzing the concentration of TOC in the fluid.

Method and apparatus for automatically measuring the concentration of TOC in a fluid used in a semiconductor manufacturing process

A pedestal of a load-cup for supporting wafers loaded onto and being unloaded from a chemical mechanical polishing (CMP) apparatus includes a pedestal plate, and a pedestal film which extends over only a limited area at the upper surface of the pedestal plate. This area includes the regions directly around the fluid ports provided in the pedestal plate for vacuum-chucking the wafers and spraying deionized water. The pedestal plate may have a cross-shaped part, the entirety of which bears the fluid ports. The pedestal film may include annular members each extending around only a respective one of the fluid ports, or one or more members each extending radially around several of the fluid ports. By offering a rather limited contact area to the wafer supported on the pedestal, the pedestal film reduces the amount of contaminants which could be transferred to the wafer surface in contact therewith.

Pedestal of a load-cup which supports wafers loaded/unloaded onto/from a chemical mechanical polishing apparatus

A drying system for drying a semiconductor substrate is provided. The drying system includes: a chamber for housing a vapor distributor and a fluid bath, said fluid bath being disposed in a lower portion of the chamber and said distributor being disposed in an upper portion of the chamber for distributing vapor for drying the substrate; and a fluid flow system for supplying fluid flow into said fluid bath for cleaning and drying the substrate and for draining said fluid from the fluid bath, wherein the chamber includes a plurality of exhaust vents disposed at the upper portion for venting the vapor.

System and method for drying semiconductor substrate

A retainer ring of a polishing head of a CMP apparatus facilitates the removal of contaminants, such as slurry debris, which have found their way into the polishing head. The retainer ring includes an annular ring body, and a plurality of contaminant outlets extending from the inner peripheral surface of the ring body to the outer peripheral surface of the ring body. Inner openings defined at the inner peripheral surface of the ring body and outer openings defined at the outer peripheral surface of the ring body by the contaminant outlets are horizontally elongated slots. Also, each of the contaminant outlets consists of a plurality of inner holes and an outer hole which is joined to the plurality of inner holes. The contaminant outlets occupy at least 30% of the radially innermost peripheral surface along a line extending circumferentially along the surface. The CMP apparatus itself includes a polishing head having such a retainer ring and a washing unit having a nozzle for spraying deionized water through the contaminant outlets of the retainer ring toward an inner space formed in the polishing head.

Polishing head of a chemical mechanical polishing apparatus and, retainer ring of the same

Growing community of inventors

Suwon, South Korea

Kyung-dae Kim