University of Michigan

Intel Corporation

Kypros Constantinides

Todd Austin

Valeria Bertacco

Sujay Abhay Phadke

Smitha Shyam

Shubhendu Sekhar Mukherjee

Srilatha Manne

Paul B Racunas

A microprocessor has a silicon area comprising a plurality of transistors implemented on the silicon area and a fault detection circuit occupying less than 20% of the silicon area and configured to detect faults at runtime in at least 80% of the plurality of transistors.

Microprocessor and method for detecting faults therein

A method for detecting microprocessor hardware faults includes sending at least one input signal to a logic block within the microprocessor, collecting an output response to the input signal from the logic block, and determining whether the output response matches an expected output response of the logic block.

Methods and apparatus to efficiently detect faults are described. In an embodiment, an encoded value may be generated based on a portion of an instruction address and a portion of a corresponding result value. The encoded value may be used to determine whether an entry corresponding to the encoded value is absent from a screening storage unit. Other embodiments are also described.

Fault detection

Growing community of inventors

Ann Arbor, MI, United States of America

Kypros Constantinides