Samsung Electronics Co., Ltd.

Kyoung-Jun Jang

Sung-Man Kim

Jong-Hwan Lee

Beom-jun Kim

Hong-Woo Lee

Yeon-Kyu Moon

Hye-Rhee Han

Gyu-Tae Kim

A gate driving circuit includes cascaded stages, each including a pull-up part, a carry part, a pull-up driving part, a holding part and an inverter. The pull-up part pulls up a gate voltage to an input clock. The carry part pulls up a carry voltage to the input clock. The pull-up driving part is connected to a control terminal (Q-node) common to the carry part and the pull-up part, and receives a previous carry voltage from a previous stage to turn on the pull-up part and the carry part. The holding part holds the gate voltage at an off-voltage, and the inverter controls at least one of turning on the holding part and turning off the holding part based on an inverter clock. A high level of the inverter clock in a given horizontal period (1H) temporally precedes a high level of the input clock by a predetermined time interval.

Gate driving circuit and display apparatus having the same

A panel assembly for a display device and a display device having the panel assembly are provided. The panel assembly for a display device includes a display region including a plurality of pixels and most of display signal lines connected to the pixels, a plurality of repair lines disposed in a shape of a ring in a peripheral region outside of the display region, and first to third auxiliary repair lines disposed in the peripheral region in parallel to data lines. An additional auxiliary repair line is provided at a right side of each of the data driving IC regions. By doing so, occurrence of disconnection and success in repairing the disconnected data lines of a display penal which is mounted in a COG scheme is tested by using a TCP type of test unit, so that it is possible to greatly reduce production costs involved in the COG type test unit.

Panel assembly for display device, display device including the same, and repairing method for display device

Growing community of inventors

Asan-si, South Korea

Kyoung-Jun Jang