Samsung Electronics Co., Ltd.

Kwang-Sik Kim

Kyung-Ho Jung

Sang-Kil Lee

Sung-Joong Kim

Min-Sub Kang

Hyon-Goo Kang

Jin-Kwan Jung

Jeong-Dae Kim

In-Seok Hwang

Min-hee Cho

Hee-Kwun Cho

Min-Hee Cho

Bong-Chan Kim

Seong-Wan Kim

An apparatus and method for rolling back operation parameters of a base station in a self-configurable broadband wireless communication system are provided, in which in a manager server, an optimizer for determining optimized operation parameters of the base station based on information which is needed to optimize and is received from the base station, an evaluator for calculating service level of the base station using the optimized operation parameters, and a controller for requesting to roll back the optimized operation parameters when the service level is greater than or equal to a first threshold value.

Apparatus and method for parameter rollback in a self configurable broadband wireless communication system

An apparatus and a method manage a neighbor base station list (NBL) in a distributed wireless ad-hoc network. Information of neighbor BSs is collected at the BS using a surrounding environment detection function. Neighbor BSs that satisfy a certain condition are determined, among the neighbor BSs from which the information is collected. And the NBL is generated based on the determined neighbor BSs.

Apparatus and method for managing neighbor BS list in distributed wireless ad hoc network

In a communication system, a base station transmits a message including neighbor base station information to a mobile station, wherein neighbor base stations in the base station include m first type neighbor base stations and n second type neighbor base stations, the message includes an identifier dedicatedly allocated to the mobile station when the mobile station can get a service from one of the n second type neighbor base stations, the first type is different from the second type, the neighbor base station information includes information on the n second type neighbor base stations, and each of m and n is an integer identical to or greater than 1.

System and method for transmitting/receiving neighbor BS information in a communication system

A pattern is inspected by acquiring a scanning electron microscope picture of an inspection pattern, and acquiring a scanning electron microscope secondary electron signal profile of the inspection pattern. A determination is made as to whether the inspection pattern is defective by comparing the scanning electron microscope picture of the inspection pattern to a scanning electron microscope picture of a sample pattern, and by comparing the scanning electron microscope secondary electron signal profile of the inspection pattern to a scanning electron microscope secondary electron signal profile of a sample pattern.

Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

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Gyeonggi-do, South Korea

Kwang-Sik Kim