Samsung Electronics Co., Ltd.

Kwang Seob Shin

Jung Hwan Choi

Joo Hwan Kim

Eun Seok Shin

Jun Young Park

Young Don Choi

Jin Do Byun

Hyun-Yoon Cho

A method includes measuring a linearity of a first pull-up circuit, a second pull-up circuit, a third pull-up circuit, a first pull-down circuit, a second pull-down circuit and a third pull-down circuit using an initial pull-up code and an initial pull-down code, each of the first pull-up circuit, the second pull-up circuit and the third pull-up circuit having a respective resistance value determined based on a respective pull-up code, and each of the first pull-down circuit, the second pull-down circuit and the third pull-down circuit having a respective resistance value determined based on a respective pull-down code, and determining a calibration setting indicator based on the measurement result, the calibration setting indicator indicating a calibration method of a transmission driver including the first pull-up circuit, the second pull-up circuit, the third pull-up circuit, the first pull-down circuit, the second pull-down circuit and the third pull-down circuit.

Memory device and method for calibrating the device and fabricating the device

Growing community of inventors

Anyang-si, South Korea

Kwang Seob Shin