Freescale Semiconductor,inc.

Nxp Usa, Inc.

Kushal Kamal

Kumar Abhishek

Sunny Gupta

Samaksh Sinha

Vandana Sapra

Siddi Jai Prakash

Sakshi Gupta

Morthala V Narsi Reddy

Regis Gubian

An integrated circuit and a method of self-testing the integrated circuit are provided. The method comprises: generating a reference voltage at an output of a reference circuit; initiating a test of the reference circuit during a test mode; determining whether the test of the reference circuit passes; and comparing, if the test of the reference circuit passes, a first voltage with the reference voltage. The disclosed test method provides for more complete testing of the integrated circuit.

Apparatus and method for self-testing an integrated circuit

An integrated circuit (IC) is connected to an automated test equipment (ATE) with pogo pins. The IC includes an analog-to-digital converter (ADC), a voltage controlled oscillator (VCO), and a compensation circuit. The ATE provides reference voltage signals to the ADC by way of the pogo pins. A potential drop across a pogo pin introduces an error in a reference voltage signal that is reflected in a digital signal generated by the ADC. The VCO generates reference frequency signals corresponding to the reference voltage signals. The compensation circuit receives the reference frequency signals and the digital signal and generates a compensation factor signal. The compensation circuit multiplies the compensation factor signal and the digital signal to generate a compensated digital signal to compensate for the error introduced by the potential drop across the pogo pins.

System for testing integrated circuit

A voltage regulation subsystem for a microprocessor has both internal and external regulation modes. An internal auxiliary voltage regulator is selectively enabled to overdrive the voltage. The enablement of the auxiliary voltage regulator is contingent upon a comparison of bandgap references of the internal and external regulators used in the respective regulation modes, which boosts the supply voltage, enables circuitry supplied by the external regulator (with the assistance of auxiliary voltage regulators) to boot robustly in extreme Process-Voltage-Temperature (PVT) conditions.

Voltage regulation subsystem

An electronic circuit includes a switchable circuit domain that operates in a RUN mode and a STANDBY mode and receives a supply current from a core power supply. A power regulator is connected between the core power supply and the switchable circuit domain to regulate the supply current provided to the switchable circuit domain when the electronic circuit is in the RUN mode. A capacitor is connected between the power regulator and ground and is charged by a refresh circuit when the electronic circuit is in the STANDBY mode. The refresh circuit maintains a voltage across the capacitor when the electronic circuit is in the standby mode, which reduces the time for the electronic circuit to transition from the STANDBY mode to the RUN mode.

Power supply circuit for reduced wake-up time

An analog-to-digital converter (ADC) converts an analog input signal to a digital output signal by sampling an analog input signal to obtain an analog sample and then converting the analog sample to the digital output signal using a successive approximation algorithm. The method decreases ADC conversion time and increases ADC throughput.

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New Delhi, India

Kushal Kamal