USA As Represented by Secretary of the Navy

Technion Research & Development Foundation Ltd

Ci Systems (israel) Ltd.

C.i. Ltd.

Kurt Weiser

Dario Cabib

Robert A Buckwald

Moshe Lavi

Stuart A Wolf

Ulrich Strom

Dan Ritter

Arnold Daniels

Elia Zeldov

Boresighting apparatus includes a laser, a thermal target having an absorbent surface for receiving the laser beam and converting it to a heat spot of infrared radiation, and an optical device for receiving and optically displaying the heat spot. The thermal target is anisotropic, having a low thermal conductivity in the direction laterally of the surface and a high thermal conductivity in the direction perpendicular to the surface, so as to increase the duration of the heat spot with a minimum lateral spreading.

Laser beam boresighting apparatus

An optical apparatus and method for measuring the diffusion length in an insulating photoconductor or a semiconductor sample material, that includes a source of coherent light; means for splitting the light source and providing transmitted and reflected beams each having a variable light intensity, one of the transmitted and reflected beams being incident as a background beam at a location on the sample material, means for directing the other of the transmitted and reflected beams so as to be incident at the location as a probe beam, the directing apparatus establishing a predetermined angle between the background and probe beams at the location, polarizing means disposed in the path of the background beam and having one of two predetermined orientations corresponding to polarized and non-polarized states of the beam passing therethrough, means disposed in the path of the probe beam for periodically blocking the passage thereof; and means for measuring changes in the periodic photocurrent supplied by a power source through the sample material in response to the operation of the periodic blocking apparatus for each of the polarized and non-polarized states to thereby determine the diffusion length of the sample material.

Optical apparatus and method for photocarrier diffusion length

A method and apparatus for the enhanced detection of a component in the base material of a sample, particularly of a semiconducting base material having traces of at least one dopant therein to be detected, involves exposing a restricted region of the sample to an intense source of photons to heat the region of the sample sufficiently to cause it to emit infrared radiation therefrom by subjecting the region to electromagnetic radiation, particularly in the form of a laser beam, having a wavelength selected so as to be absorbed by the component to an appreciably larger extent than by the base material, and detecting, by an infrared detector, the infrared radiation emitted by the respective region of the sample as a result of the heating of the component therein produced by the exposure to the electromagnetic radiation.

Method and apparatus for the enhanced detection of a component of a

A granular superconducting thin film bolometer made by anodizing a thin film of such materials as niobium nitride to form a thin granular film separated by and covered with the anodized oxide. The bolometer is cooled to its superconducting state and electrically connected to a biasing and detecting network. Its temporal response is better than 1 ns.

Fast granular superconducting bolometer

Growing community of inventors

Haifa, Israel

Kurt Weiser