Bruker Axs Gmbh

Kurt Erlacher

Joachim Lange

Detlef Bahr

An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qof the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (O) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qbetween first collimator (bl) and X-ray source (Q) is:/tan &#x3b1;,wherein &#x3b1;is the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl). This permits reduction of the disturbing radiation on the sample for constant useful X-radiation power from the source Q.

Growing community of inventors

Graz, Austria

Kurt Erlacher