Nxp Usa, Inc.

Kuo-Hsuan Meng

Hector Adrian Sanchez

James W Miller

Gayathri Bhagavatheeswaran

An integrated circuit (IC) includes an input/output (IO) circuit in a first power domain, coupled between a first and second power supply terminal, and an integrity monitor in a second power domain, coupled between a third and fourth power supply terminal. The IO circuit includes an external terminal configured to communicate signals external to the IC, and an internal circuit node configured to provide a tap signal, wherein the internal circuit node is neither the first power supply terminal nor the second power supply terminal. The integrity monitor has a counter configured to provide a count value by counting each time the tap signal reaches a threshold voltage, and is configured to provide an integrity fault indicator based at least in part on the count value, in which the integrity fault indicator indicates whether or not a signal provided or received by the external terminal is trustworthy.

Integrity monitoring for input/output (IO) circuits of a system on a chip (SOC)

An ESD protection circuit includes a detection circuit for detecting an ESD event. The detection circuit includes two current mirrors each for providing two detection signals. The ESD protection circuit includes driver circuitry that produces trigger signals to clamp circuits that make conductive the clamp circuits in response to an ESD event based on the detection signals from the current mirrors.

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Austin, TX, United States of America

Kuo-Hsuan Meng