Yamaha Corporation

Toyota Jidosha Kabushiki Kaisha

Denso Corporation

Kunito Takahashi

Tsuyoshi Okami

Akiyoshi Sato

Masao Noro

Nobuaki H Tsuji

Akihiko Toda

Tatsuya Kishii

Keizoh Kawaguchi

Ichiro Shigetomi

Shoji Yasui

A microphone-loudspeaker integrated apparatus includes a plurality of microphones, a loudspeaker, and a synthesis unit. The loudspeaker is disposed between the plurality of microphones. The synthesis unit synthesizes sounds collected from the plurality of microphones. A distance between the plurality of microphones is set so as to fall within a range within which sound at a frequency needed for recognizing voice is collectable and within a range within which a noise amount due to vibration of the loudspeaker is allowable, when voice recognition is performed based on sound obtained through synthesis by the synthesis unit.

Microphone-loudspeaker integrated apparatus and vehicle

A sound output device includes: a speaker unit that has a sound emitting portion; an attaching member by which the speaker unit is attached to an object; a separating member that is provided between the speaker unit and the attaching member to separate the speaker unit from the attaching member; and a sealing member that is provided between the speaker unit and the attaching member to reduce a sound that is emitted from a side of the speaker unit opposite to the sound emitting portion and is transmitted to a sound emitting portion side. The attaching member has a first portion on a side of the sound emitting portion of the speaker unit, and the first portion of the attaching member has an opening that corresponds to the sound emitting portion.

Sound output device

A test signal supplying device includes a first external terminal, a second external terminal being applied with a predetermined electric potential, an internal load, a first terminal that is connected to the first external terminal through the internal load, a second terminal that is connected to the first external terminal without passing through the internal load, a test signal generating section that generates a test signal and supplies the test signal to the second terminal, a detecting section that detects an amplitude of the test signal, and a controlling section that measures an impedance of an external load connected to the first and second external terminals based on the detected amplitude of the test signal.

Test signal supplying device and semiconductor integrated circuit

A laser diode driving circuit is provided, which is capable of supplying a laser diode thereof with a high-speed pulse current. A current source supplies a current to the laser diode. An NMOS transistor as a first switch is connected between the current source and the laser diode. An NMOS transistor as a second switch is connected between a junction between the current source and the first switch and a pseudo load. A controller supplies a first voltage pulse signal to the first switch and a second voltage pulse signal opposite in phase to the first voltage pulse signal to the second switch to switch the first and second switches in a complementary manner.

Laser diode driving circuit

The present invention provides a high-accuracy and multi-bit D/A converter which can be produced using a CMOS process. A resistor string is formed of a plurality of resistors connected in series. A switch matrix has switch strings each formed of switches each having one end thereof connected to a corresponding one of junctions of the resistors and having respective other ends commonly connected to one of common junctions. A decoder turns on and off the switches of the switch strings according to more significant bits of data for conversion. A less significant bits-conversion circuit generates a voltage corresponding to less significant bits of the data for conversion and outputs the voltage. An operational amplifier carries out addition or subtraction of a voltage at each of the common junctions and an output from the less significant bits-conversion circuit.

Growing community of inventors

Hamamatsu, Japan

Kunito Takahashi