Panasonic Corporation

Panasonic Intellectual Property Management Co., Ltd.

Kunihiro Maki

Manabu Inoue

Masahiro Nakanishi

Toshiyuki Honda

Masayuki Toyama

Tetsushi Kasahara

Tomoaki Izumi

Kazuaki Tamura

Kiminori Matsuno

Shigekazu Kogita

It is possible to accurately detect a physical block which has caused a fixture defect in a flash memory so as to limit the use of the physical block. By recording a history of generation of a physical block error and a history of physical erasing in an ECC error record, it is judged whether the error which has occurred is accidental or caused by a fixture defect. When no error is caused in the data written by physical erasing after a first read error occurrence, the first error is accidental and if another error is caused, the error is judged to be caused by a fixture defect. By using such an ECC error record, it is possible to accurately judge whether the error is accidental or caused by a fixture defect. By eliminating use of the physical block judged to have a fixture defect, it is possible to reduce read errors.

Nonvolatile storage device, memory controller, and defective region detection method

In a storage having a nonvolatile RAM of destructive read type, the number of restorations attributed to data read from the nonvolatile RAM is decreased, and the overall life of the storage is prolonged. In a storage having a nonvolatile RAM of destructive read type and a volatile RAM and holding the same data in the nonvolatile and volatile RAMs, data is read out of the volatile RAM in reading and data is written in both volatile and nonvolatile RAMs in writing.

Memory module, memory controller, nonvolatile storage, nonvolatile storage system, and memory read/write method

Growing community of inventors

Osaka, Japan

Kunihiro Maki