Sony Corporation

Kunihiko Take

Keiji Kanota

Ryogo Ito

Katsuhiko Watanabe

Kenichiro Imai

Junichi Yokota

Hirofumi Todo

Fumihiko Kaise

Hiroshi Shimono

Ko Kobayashi

A recording device which records data onto a recording medium includes a nonvolatile memory storing and holding data on a free capacity of the recording medium, and a control unit controlling the data recording. The control unit determines the free-capacity data stored in the nonvolatile memory based on the total capacity of the recording medium when power is turned on. When the determination result indicates that a value of the free-capacity data stored in the nonvolatile memory does not exceed a value of the total capacity of the recording medium, the control unit records the data onto the recording medium with reference to the free-capacity data. When the power is turned off, the control unit updates the free-capacity data so as to reduce the value of the free-capacity data by as much as an amount of the data recorded onto the recording medium.

Recording device, recording-medium-management method, program of recording-medium-management method, and recording medium recording program of recording-medium-management method

A semiconductor wafer examination system can accurately and reliably detects defects of semiconductor wafers. The semiconductor wafer examination systemcomprises a defect classification device for automatically classifying defects of semiconductor wafers on the basis of defect detection parameters and a knowledge base and a classification support device for supporting the operation of the defect classification device. The defect detection parameters define the permissible deviation of the surface image of a defective semiconductor wafer from that of a normal semiconductor wafer. The knowledge base contains data for the types of defects that can occur in semiconductor wafers and data for showing the characteristics of each type. The classification support device prepares data on isolated defective areas that are used for selecting and/or altering the defect detection parameters and preparing the knowledge base.

Semiconductor wafer examination system

Growing community of inventors

Kanagawa, Japan

Kunihiko Take