National Instruments Corporation

Kunal H Patel

Brian Keith Odom

Daniel S Wertz

Dustyn K Blasig

Duncan G Hudson, Iii

Hector M Rubio

Rafael Castro Scorsi

Christopher Frederick Graf

John G Banaska

Adam C Ullrich

Marcos Kirsch

Jeffrey Allan Cornell

Reid Lee

Kalyanramu Vemishetty

Charles L Corley, Ii

David E Klipec

Tobias Gordon

Stephen A Hanssen

Matthew Tate Dougan

Wendi Song

Jun Lu

Ryan P Verret

Tyler Healy

Joseph H DiGiovanni

Xuechen Han

Laura Nayman

Jeronimo Mota

Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.

Nanoseconds-pulse based current/voltage measurement for testing vertical-cavity surface-emitting laser

Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.

Session management for interactive debugging

System and method for extending programmable device functionality while preserving functionality of the device driver and driver IP. User input may be received specifying functionality of custom IP for a programmable measurement device with standard driver IP. The custom IP may be generated accordingly, and may be deployable to the programmable measurement device. During operation the custom IP may communicate directly with the standard driver IP and may provide custom functionality of the programmable measurement device while preserving functionality of the standard driver IP on the programmable measurement device and the standard device driver.

Extending programmable measurement device functionality

A digitizer system (DS) may include one or more input channels to receive sample data, and an acquisition state machine (ASM) to organize the sample data into one or more acquisition records according to events of interest, and generate framing information corresponding to the one or more acquisition records. The events of interest may be identified by a trigger circuit in the DS, and relayed to the ASM for organizing the sample data. The DS may further include a data interface capable of receiving the one or more acquisition records and the framing information, encoding the one or more acquisition records and the framing information into encoded data, and transmitting the encoded data to an expansion module. The expansion module may receive the encoded data, decode the encoded data, and recover the sample data from the decoded data according to the framing information and the one or more acquisition records.

Integrated digitizer system with streaming interface

Receiving a modulated carrier signal that is modulated using a reference signal, wherein an acquisition by a digitizer is synced to the reference signal such that the modulated carrier signal has known timing with respect to a start of an acquisition within the digitizer. Further including routing the modulated carrier signal through a receiver system to generate a processed signal, receiving the processed signal at the digitizer, digitizing the processed signal at the digitizer, and determining a delay of the modulated carrier signal routed through the receiver system based on the timing of the processed signal.

Calibration system and method

Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.

Deterministic reconfiguration of measurement modules using double buffered DMA

A system may include a plurality of subsystems, e.g. instrumentation units housed in separate chassis, each chassis including multiple instrumentation devices, e.g. data acquisition cards. Each subsystem may generate a local reference clock, which may be phase aligned and locked with respect to one or more similar reference clocks of other subsystems, via a high-level precision time protocol (PTP). Each instrumentation device within a given subsystem may generate its own sample clock based on the local reference clock, and may generate its own trigger clock based on its own sample clock. All trigger clocks may be synchronized with respect to each other through a future time event issued using the PTP, and each instrumentation device may then use its trigger clock to synchronize any received trigger pulses, which may also be issued through future time events using the PTP. This results in synchronizing the received triggers across all participating instrumentation devices across all participating subsystems, ensuring that data acquisition is properly synchronized across the multiple subsystems.

Cross controller clock synchronization

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Austin, TX, United States of America

Kunal H Patel