Au Optronics Corporation

National Central University

Kun-Ying Shin

Ching-Huan Lin

Chia-Wei Kuo

Chuen-Horng Tsai

Yi-Yang Liao

Cheng-Hsun Nien

Wen-Bin Jian

A display panel including a plurality of unit regions is provided. The unit regions are arranged along a first direction and a second direction to form a plurality of columns and a plurality of rows. Each of the unit regions of the display panel includes a plurality of first color sub-pixels, a plurality of second color sub-pixels, and a plurality of third color sub-pixels. In any of the rows, a first pitch between any one of the first color sub-pixels and a next of the first color sub-pixels has at least four kinds of distances.

Display panel with varied subpixel arrangement sequences

An electron microscope suitable for observing at least one sample is provided. The sample has at least one testing area, and a material of the sample on the testing area is semiconductive or conductive. The electron microscope includes a stage, an electron gun, and at least one probe. The stage is suitable for carrying the sample and the sample is not electrically grounded. The electron gun is suitable for generating an electron beam and accumulating charges on the sample. When the probe contacts with the testing area, the image contrast of the testing area will change. The current through the probe will also change upon contact. Methods have been provided based on these principles to determine 'when' and 'where' the probe starts to contact the sample surface inside an electron microscope.

Electron microscope, methods to determine the contact point and the contact of the probe

Growing community of inventors

Hsinchu, Taiwan

Kun-Ying Shin