Samsung Electronics Co., Ltd.

Kumud Kumar Sinha

Tushar Vrind

Lalit Kumar Pathak

Debabrata Das

Mohanraja Balasubramaniam

Palani Kumar Subramanian

A method for determining a number of paths between a Radio Frequency Integrated Circuit (RFIC) and a plurality of Subscriber Identity Modules (SIMS) of a User Equipment (UE), the plurality of SIMS including a primary SIM and a secondary SIM, the method including detecting, by the UE, at least one event associated with the secondary SIM, determining, by the UE, a tune away duration associated with the primary SIM based on the at least one event associated with the secondary SIM, determining, by the UE, an amount of resource loss by the primary SIM and a data throughput reduction of the primary SIM based on the tune away duration, and determining, by the UE, the number of paths between the RFIC and the plurality of SIMS based on the amount of resource loss by the primary SIM and the data throughput reduction of the primary SIM.

Method and UE for identifying optimal number of paths between RFIC and plurality of SIMS

A method is provided. The method includes determining, in a determination by an electronic testing device, one or more locations in a cellular network where a test case is to be executed, a time at which the test case is to be executed at the one or more locations, a number of times the test case is to be executed at the one or more locations, or a type of a test equipment on which the test case is to be executed. A test context for testing a user equipment is determined based on a result of the determination. An optimal test case is determined from a test case repository, based on the test context, and the optimal test case is executed.

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Bengaluru, India

Kumud Kumar Sinha