Fujitsu Corporation

Kumiko Teramae

Hikoyuki Kawata

Atsushi Takeuchi

Masaki Tosaka

Takashi Fukuda

Kenji Nagase

Toshiro Sato

Yoshiyuki Iwakura

Eiji Ohta

Yuji Suwa

Megumi Tanaka

Tsunaki Iwasaki

A via model generation method includes: acquiring via arrangement information including a hole diameter of a via formed in a board including a plurality of wiring layers, a clearance distance between a ground conductor formed in one wiring layer of the plurality of wiring layers and the via, and a ground via distance between the via and a ground via coupled to the ground conductor; acquiring board information including a relative dielectric constant of the board; calculating a capacitance component of the via by a first electromagnetic field analysis using the hole diameter of the via, the clearance distance, and the relative dielectric constant of the board; calculating an inductance component of the via by a second electromagnetic field analysis using the hole diameter of the via, the ground via distance, and the relative dielectric constant of the board; and generating a via model including the capacitance and inductance components.

Via model generation method, information processing device, and non-transitory computer-readable recording medium storing via model generation program

An information processing device include: a memory; and one or more processors which are coupled to the memory, wherein the one or more processors performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate; and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; and performing waveform analysis on the signal waveform using the generated analysis model.

Information processing device and waveform verification method

An information processing device includes a memory; and one or more processors which are coupled to the memory and configured to performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate, and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes generating analysis models of a plurality of respective combinations of variations in a plurality of kinds of elements which have an influence on the quality of the signal waveform; calculating impulse-response-waveforms of the plurality of respective combinations using the generated analysis models; calculating the noise amount of the plurality of respective combinations based on the calculated impulse-response-waveforms; selecting a combination, in which the calculated noise amount is the largest, as a worst case in the plurality of combinations; and performing signal waveform-transition-analysis on the selected worst case.

A computer-readable-recording-medium stored a program for causing a computer to execute: judging, for each of elements of a plurality of scattering parameters, whether a difference between a first-area in a plane containing an axis representing frequency and an axis representing the element, and a second-area in the plane is within a permissible range, the first-area being surrounded by a first-element-value series of the element that is defined in advance for a plurality of first-frequencies, the second-area being surrounded by a second-element-value series that is obtained by performing interpolation calculation from the first-element-value series for a plurality of second frequencies which are different from the plurality of first-frequencies and which are provided at regular intervals; and determining, by performing the judging for one interval or a plurality of intervals, an interval so that the difference falls within the permissible range for all of the elements of the plurality of scattering parameters.

Information processing method and apparatus for deciding control parameters

A coupled analysis simulation apparatus includes a coupled analysis processing unit configured to perform coupled analysis by performing electromagnetic field analysis and circuit analysis in coordination with each other, the electromagnetic field analysis being performed on a space including conductive layers to which an electronic circuit module is connected, the circuit analysis being performed on the electronic circuit module; a first generating unit configured to generate a virtual conductive part in a section or a region including connection parts connecting the electronic circuit module with the conductive layers; and a second generating unit configured to generate virtual connection parts that virtually connect the virtual conductive part with the conductive layers at positions where the connection parts are connected to the conductive layers.

Coupled analysis simulation apparatus and coupled analysis simulation method

An analyzing apparatus includes a result-data storing unit that determines whether result data that is calculated as a result of analysis is restorable by linear interpolation. If the result data is determined to be unrestorable by the linear interpolation, the result-data storing unit stores the result data in a predetermined storage unit. Moreover, the analyzing apparatus includes a data restoring unit that reads the result data from the storage unit. The data restoring unit performs the linear interpolation using the result data acquired, thereby restoring the result data.

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Setagaya, Japan

Kumiko Teramae