United States of America As Represented by the Secretary of the Air Force

Kumar V Jata

Shamachary Sathish

John T Welter

Richard Reibel

Vijayaraghava Nalladega

Mark P Blodgett

An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

Atomic force microscopy system and method for nanoscale measurement

A non-contact near field high resolution acoustic imaging system of a sample, the system including an acoustic wave generator generating a plurality of acoustic waves a ultrasonic horn amplifying the waves to an amplitude of between about 20 microns and about 300 microns, and a frequency between about 20 kHz and about 40 khz. The ultrasonic horn further directs the amplified waves to impinge upon the sample. On contact between the waves and the sample, a plurality of transmitted energy is transmitted to the sample, a plurality of longitudinal displacements and surface acoustic wave displacements in the sample are created. An adjustable separation distance lies between the sample and the ultrasonic horn, the distance adjusted to maximize the transmitted energy. The distance is preferably greater than the maximum displacement of the ultrasonic horn, or approximately 0.1 mm. The non-contact near field high resolution acoustic imaging system further includes a surface displacement detector for detecting the longitudinal wave displacements or surface acoustic wave displacements, the detector including a tip and a tip diameter; and a computer for digitizing and storing the longitudinal wave displacements or surface acoustic wave displacements. The longitudinal displacements or surface acoustic wave displacements are analyzed to create an image of at least a portion of the sample, the image alternatively having a resolution about equal to the surface displacement detector tip diameter.

Growing community of inventors

Dayton, OH, United States of America

Kumar V Jata