Taiwan Semiconductor Manufacturing Comp. Ltd.

Kuang-Ming Wang

Wei-Yi Hu

Chin-Cheng Kuo

A method is disclosed that includes performing a first simulation by applying first variations to identify at least one sample of an integrated circuit (IC), wherein the IC comprises at least one device; translating individual variables of split devices implementing the at least one device, to an equivalent variable for the split devices; and performing a second simulation, by applying at least a portion of second variations, with the equivalent variable for the split devices, to obtain a simulation result serving as a basis of modifying the layout for fabrication of the IC.

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Hsinchu, Taiwan

Kuang-Ming Wang